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Bi-Spectrum Scattering Model for Dielectric Randomly Rough Surface 被引量:3
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作者 刘宁 李宗谦 《Tsinghua Science and Technology》 SCIE EI CAS 2003年第5期617-623,共7页
The bistatic scattering model is offen used for remote microwave sensing. The bi-spectrum model (BSM) for conducting surfaces was used to develop a scattering model for dielectric randomly rough surfaces to estimate ... The bistatic scattering model is offen used for remote microwave sensing. The bi-spectrum model (BSM) for conducting surfaces was used to develop a scattering model for dielectric randomly rough surfaces to estimate their bistatic scattering coefficients. The model for dielectric rough surfaces differs from the BSM for a conducting surface by including Fresnell reflection and transmission from dielectric rough surfaces. The bistatic scattering coefficients were defined to satisfy the reciprocal theorem. Values calculated using the BSM for dielectric randomly rough surfaces compare well with those of the integral equation model (IEM) and with experimental data, showing that the BSM accuracy is acceptable and its range of validity is similar to that of IEM while the BSM expression is simpler than that of IEM. 展开更多
关键词 dielectric randomly rough surface spectral domain bi-spectrum method bistatic scattering coefficients bi-spectrum scattering model microwave remote sensing
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