The critical electric fields of hot SF6 are calculated including both electron and ion kinetics in wide ranges of temperature and pressure, namely from 300 K up to 4000 K and 2 atmospheres up to 32 atmospheres respect...The critical electric fields of hot SF6 are calculated including both electron and ion kinetics in wide ranges of temperature and pressure, namely from 300 K up to 4000 K and 2 atmospheres up to 32 atmospheres respectively. Based on solving a multi-term electron Boltz- mann equation the calculations use improved electron-gas collision cross sections for twelve SF6 dissociation products with a particular emphasis on the electron-vibrating molecule interactions. The ion kinetics is also considered and its role on the critical field becomes non negligible as the temperature is above 2000 K. These critical fields are then used in hydrodynamics simulations which correctly predict the circuit breaker behaviours observed in the case of breaking tests.展开更多
Epoxy resin laminate onto which a pair of copper foil was printed was employed as test samples.The samples were placed in an artificial atmospheric chamber, which was vacuumed by a rotary pump from 100 kPa to 5 kPa.Th...Epoxy resin laminate onto which a pair of copper foil was printed was employed as test samples.The samples were placed in an artificial atmospheric chamber, which was vacuumed by a rotary pump from 100 kPa to 5 kPa.The magnetic field was produced by permanent magnets that were assembled to make E×B drift away from, into and parallel to the sample surface, respectively.Magnetic flux density was adjusted at 120 mT, 180 mT and 240 mT respectively.By applying a negative bias voltage between the electrodes, the time to surface breakdown was recorded.Obtained results show that when E×B is into the surface, the time to the breakdown is shortened;when E×B is away from the surface, the time to the breakdown is delayed;when E×B is parallel to the surface, the time to the breakdown remains approximately the same as the case without magnetic field.With the decrease of pressure, the time to the breakdown increases and the effect of magnetic field on breakdown appears to be strengthened.展开更多
为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种...为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种具有固定参考电阻的VCMA-MTJ读电路和一种具有参考电阻调控单元的VCMA-MTJ读电路,研究了软击穿对VCMA-MTJ电阻R_(t)、隧穿磁阻比率M、软击穿时间T_(s)以及VCMA-MTJ读电路读错误率的影响。结果表明:软击穿的出现会导致R_(t)和M均随应力时间t的增加而降低,T_(s)随氧化层厚度t_(ox)的增大而缓慢增加,却随脉冲电压V_(b)的增大而迅速减少,与反平行态相比,平行态的T_(s)更短且M降低50%所需时间更少;具有固定参考电阻的VCMA-MTJ读电路可有效避免读“0”错误率的产生,但读“1”错误率却随t的增加而上升,而具有参考电阻调控单元的VCMA-MTJ读电路可在保持读“0”正确率的同时,对读“1”错误率改善达54%,在一定程度上削弱了软击穿对VCMA-MTJ读电路的影响。展开更多
文摘The critical electric fields of hot SF6 are calculated including both electron and ion kinetics in wide ranges of temperature and pressure, namely from 300 K up to 4000 K and 2 atmospheres up to 32 atmospheres respectively. Based on solving a multi-term electron Boltz- mann equation the calculations use improved electron-gas collision cross sections for twelve SF6 dissociation products with a particular emphasis on the electron-vibrating molecule interactions. The ion kinetics is also considered and its role on the critical field becomes non negligible as the temperature is above 2000 K. These critical fields are then used in hydrodynamics simulations which correctly predict the circuit breaker behaviours observed in the case of breaking tests.
基金Supported by National Natural Science Foundation of China (No.50777048)
文摘Epoxy resin laminate onto which a pair of copper foil was printed was employed as test samples.The samples were placed in an artificial atmospheric chamber, which was vacuumed by a rotary pump from 100 kPa to 5 kPa.The magnetic field was produced by permanent magnets that were assembled to make E×B drift away from, into and parallel to the sample surface, respectively.Magnetic flux density was adjusted at 120 mT, 180 mT and 240 mT respectively.By applying a negative bias voltage between the electrodes, the time to surface breakdown was recorded.Obtained results show that when E×B is into the surface, the time to the breakdown is shortened;when E×B is away from the surface, the time to the breakdown is delayed;when E×B is parallel to the surface, the time to the breakdown remains approximately the same as the case without magnetic field.With the decrease of pressure, the time to the breakdown increases and the effect of magnetic field on breakdown appears to be strengthened.
文摘为了解决软击穿导致的压控磁各向异性磁隧道结(voltage-controlled magnetic anisotropy magnetic tunnel junction,VCMA-MTJ)及其读电路性能下降的问题,在对VCMA-MTJ软击穿机理深入分析的基础上,修正了VCMA-MTJ的电学模型,设计了一种具有固定参考电阻的VCMA-MTJ读电路和一种具有参考电阻调控单元的VCMA-MTJ读电路,研究了软击穿对VCMA-MTJ电阻R_(t)、隧穿磁阻比率M、软击穿时间T_(s)以及VCMA-MTJ读电路读错误率的影响。结果表明:软击穿的出现会导致R_(t)和M均随应力时间t的增加而降低,T_(s)随氧化层厚度t_(ox)的增大而缓慢增加,却随脉冲电压V_(b)的增大而迅速减少,与反平行态相比,平行态的T_(s)更短且M降低50%所需时间更少;具有固定参考电阻的VCMA-MTJ读电路可有效避免读“0”错误率的产生,但读“1”错误率却随t的增加而上升,而具有参考电阻调控单元的VCMA-MTJ读电路可在保持读“0”正确率的同时,对读“1”错误率改善达54%,在一定程度上削弱了软击穿对VCMA-MTJ读电路的影响。
