This paper reports the physical realization of the Bipolar Field-Effect Transistor （BiFET） and its onetransistor basic building block circuits. Examples are given for the one and two MOS gates on thin and thick, pur...This paper reports the physical realization of the Bipolar Field-Effect Transistor （BiFET） and its onetransistor basic building block circuits. Examples are given for the one and two MOS gates on thin and thick, pure and impure base, with electron and hole contacts, and the corresponding theoretical current-voltage characteristics previously computed by us, without generation-recombination-trapping-tunneling of electrons and holes. These examples include the one-MOS-gate on semi-infinite thick impure base transistor （the bulk transistor） and the impurethin-base Silicon-on-Insulator （SOI） transistor and the two-MOS-gates on thin base transistors （the FinFET and the Thin Film Transistor TFF）. Figures are given with the cross-section views containing the electron and hole concentration and current density distributions and trajectories and the corresponding DC current-voltage characteristics.展开更多
基金This investigation and Jie Binbin have been supported by the CTSAH Associates (CTSA)founded by the late Linda Su-Nan Chang Sah,in memory of her 70th year.
文摘This paper reports the physical realization of the Bipolar Field-Effect Transistor （BiFET） and its onetransistor basic building block circuits. Examples are given for the one and two MOS gates on thin and thick, pure and impure base, with electron and hole contacts, and the corresponding theoretical current-voltage characteristics previously computed by us, without generation-recombination-trapping-tunneling of electrons and holes. These examples include the one-MOS-gate on semi-infinite thick impure base transistor （the bulk transistor） and the impurethin-base Silicon-on-Insulator （SOI） transistor and the two-MOS-gates on thin base transistors （the FinFET and the Thin Film Transistor TFF）. Figures are given with the cross-section views containing the electron and hole concentration and current density distributions and trajectories and the corresponding DC current-voltage characteristics.
