In order to capture and storage video data real-time for carrier-based photoelectric warning system, An acquisition and storage system based on FPGA is designed. To complete the asynchronous interface timing of the ca...In order to capture and storage video data real-time for carrier-based photoelectric warning system, An acquisition and storage system based on FPGA is designed. To complete the asynchronous interface timing of the camera and the storage system, the video data which come from infrared camera and visible light camera is stored to FIFO by FPGA, and then four SDRAM as cache and ping-pong operation cache-data storage to the CF card, this structure not only takes advantage of high-speed reading and writing skills of CF card, but also to ensure the integrity of the video data. In the final experiment proved that the system can be effectively applied to ships the photoelectric warning scanning system, its performance fully meet the needs of practical application.展开更多
For modern scaling devices,multiple cell upsets(MCUs)have become a major threat to high-reliability field-programmable gate array(FPGA)-based systems.Thus,both performing the worst-case irradiation tests to provide th...For modern scaling devices,multiple cell upsets(MCUs)have become a major threat to high-reliability field-programmable gate array(FPGA)-based systems.Thus,both performing the worst-case irradiation tests to provide the actual MCU response of devices and proposing an effective MCU distinction method are urgently needed.In this study,high-and medium-energy heavy-ion irradiations for the configuration random-access memory of 28 nm FPGAs are performed.An MCU extraction method supported by theoretical predictions is proposed to study the MCU sizes,shapes,and frequencies in detail.Based on the extraction method,the different percentages,and orientations of the large MCUs in both the azimuth and zenith directions determine the worse irradiation response of the FPGAs.The extracted largest 9-bit MCUs indicate that high-energy heavy ions can induce more severe failures than medium-energy ones.The results show that both the use of high-energy heavy ions during MCU evaluations and effective protection for the application of high-density 28 nm FPGAs in space are extremely necessary.展开更多
文摘In order to capture and storage video data real-time for carrier-based photoelectric warning system, An acquisition and storage system based on FPGA is designed. To complete the asynchronous interface timing of the camera and the storage system, the video data which come from infrared camera and visible light camera is stored to FIFO by FPGA, and then four SDRAM as cache and ping-pong operation cache-data storage to the CF card, this structure not only takes advantage of high-speed reading and writing skills of CF card, but also to ensure the integrity of the video data. In the final experiment proved that the system can be effectively applied to ships the photoelectric warning scanning system, its performance fully meet the needs of practical application.
基金supported by the National Natural Science Foundation of China(Nos.12035019 and 11690041).
文摘For modern scaling devices,multiple cell upsets(MCUs)have become a major threat to high-reliability field-programmable gate array(FPGA)-based systems.Thus,both performing the worst-case irradiation tests to provide the actual MCU response of devices and proposing an effective MCU distinction method are urgently needed.In this study,high-and medium-energy heavy-ion irradiations for the configuration random-access memory of 28 nm FPGAs are performed.An MCU extraction method supported by theoretical predictions is proposed to study the MCU sizes,shapes,and frequencies in detail.Based on the extraction method,the different percentages,and orientations of the large MCUs in both the azimuth and zenith directions determine the worse irradiation response of the FPGAs.The extracted largest 9-bit MCUs indicate that high-energy heavy ions can induce more severe failures than medium-energy ones.The results show that both the use of high-energy heavy ions during MCU evaluations and effective protection for the application of high-density 28 nm FPGAs in space are extremely necessary.
