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Fractal characterization for the mining crack evolution process of overlying strata based on microseismic monitoring technology 被引量:4
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作者 Liu Chao Xue Junhu +1 位作者 Yu Guofeng Cheng Xiaoyu 《International Journal of Mining Science and Technology》 SCIE EI CSCD 2016年第2期295-299,共5页
In order to study the evolution laws during the development process of the coal face overburden rock mining-induced fissure,we studied the process of evolution of overburden rock mining-induced fissures and dynamicall... In order to study the evolution laws during the development process of the coal face overburden rock mining-induced fissure,we studied the process of evolution of overburden rock mining-induced fissures and dynamically quantitatively described its fractal laws,based on the high-precision microseismic monitoring method and the nonlinear Fractal Geometry Theory.The results show that:the overburden rock mining-induced fissure fractal dimension experiences two periodic change processes with the coal face advance,namely a Small→ Big→ Small process,which tends to be stable;the functional relationship between the extraction step distance and the overburden rock mining-induced fissure fractal dimension is a cubic curve.The results suggest that the fractal dimension reflects the evolution characteristics of the overburden rock mining-induced fissure,which can be used as an evaluation index of the stability of the overburden rock strata,and it provides theoretical guidance for stability analysis of the overburden rock strata,goaf roof control and the support movements in the mining face. 展开更多
关键词 Microseismic monitoring technology Fractal characterization Mining crack Evolution law Overlying strata
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Recent progress and challenges on two-dimensional material photodetectors from the perspective of advanced characterization technologies 被引量:4
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作者 Fang Zhong Hao Wang +10 位作者 Zhen Wang Yang Wang Ting He Peisong Wu Meng Peng Hailu Wang Tengfei Xu Fang Wang Peng Wang Jinshui Miao Weida Hu 《Nano Research》 SCIE EI CAS CSCD 2021年第6期1840-1862,共23页
Atomically thin two-dimensional(2D)materials exhibit enormous potential in photodetectors because of novel and extraordinary properties,such as passivated surfaces,tunable bandgaps,and high mobility.High-performance p... Atomically thin two-dimensional(2D)materials exhibit enormous potential in photodetectors because of novel and extraordinary properties,such as passivated surfaces,tunable bandgaps,and high mobility.High-performance photodetectors based on 2D materials have been fabricated for broadband,position,polarization-sensitive detection,and large-area array imaging.However,the current performance of 2D material photodetectors is not outstanding enough,including response speed,detectivity,and so forth.The way to further promote the development of 2D material photodetectors and their corresponding practical applications is still a tremendous challenge.In this article,these issues of 2D material photodetectors are analyzed and expected to be solved by combining micro-nano characterization technologies.The inherent physical properties of 2D materials and photodetectors can be accurately characterized by Raman spectroscopy,transmission electron microscopy(TEM),and scattering scanning near-field optical microscope(s-SNOM).In particular,the precise probe of lattice defects,doping concentration,and near-field light absorption characteristics can promote the researches of low-noise and high-responsivity photodetectors.Scanning photocurrent microscope(SPCM)can show the overall spatial distribution of photocurrent and analyze the mechanism of photocurrent.Photoluminescence(PL)spectroscopy and Kelvin probe force microscope(KPFM)can characterize the material bandgap,work function distribution and interlayer coupling characteristics,making it possible to design high-performance photodetectors through energy band engineering.These advanced characterization techniques cover the entire process from material growth,to device preparation,and to performance analysis,and systematically reveal the development status of 2D material photodetectors.Finally,the prospects and challenges are discussed to promote the application of 2D material photodetectors. 展开更多
关键词 characterization technologies PHOTODETECTORS two-dimensional materials atomically thin
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