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Dynamics of Charge Transfer by Surface Electric Discharges in Atmospheric Air
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作者 Alec Houpt Sergey B. Leonov 《Journal of Applied Mathematics and Physics》 2015年第8期1062-1071,共10页
This work reveals essential details of plasma-surface interaction in atmospheric air that are important for a wide range of applications, beginning from airflow control and up to the high-voltage insulation. The paper... This work reveals essential details of plasma-surface interaction in atmospheric air that are important for a wide range of applications, beginning from airflow control and up to the high-voltage insulation. The paper discusses experimental data characterizing dynamics of development and kinetics of energy coupling in surface dielectric barrier discharge (SDBD), atmospheric air plasmas sustained over dielectric surfaces, over a wide range of time scales. The experiments have been conducted using microsecond pulse voltage waveform of single and alternating polarities. Time-resolved discharge development and mechanisms of coupling with quiescent air are analyzed using nanosecond gate camera imaging, electrical measurements, and original surface charge sensors. The results demonstrate several new, critically important processes overlooked in previous studies. Specifically, it is shown that SDBD plasmas energy release may be significantly increased by using an optimized waveform. 展开更多
关键词 SURFACE barrier PLASMAS Electric charge transfer SURFACE potential DYNAMICS of charge DISSIPATION
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Measurement of charge transfer potential barrier in pinned photodiode CMOS image sensors 被引量:1
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作者 曹琛 张冰 +1 位作者 王俊峰 吴龙胜 《Journal of Semiconductors》 EI CAS CSCD 2016年第5期56-60,共5页
The charge transfer potential barrier (CTPB) formed beneath the transfer gate causes a noticeable image lag issue in pinned photodiode (PPD) CMOS image sensors (CIS), and is difficult to measure straightforwardl... The charge transfer potential barrier (CTPB) formed beneath the transfer gate causes a noticeable image lag issue in pinned photodiode (PPD) CMOS image sensors (CIS), and is difficult to measure straightforwardly since it is embedded inside the device. From an understanding of the CTPB formation mechanism, we report on an alternative method to feasibly measure the CTPB height by performing a linear extrapolation coupled with a horizontal left-shift on the sensor photoresponse curve under the steady-state illumination. The theoretical study was pertbrmed in detail on the principle of the proposed method. Application of the measurements oil a prototype PPD-CIS chip with an array of 160 ×160 pixels is demonstrated. Such a method intends to shine new light oil the guidance for the lag-free and high-speed sensors optimization based on PPD devices. 展开更多
关键词 CMOS image sensors (C1S) pinned photodiode (PPD) charge transfer potential barrier (ctpb photoresponse curve
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Charge transfer efficiency improvement of a 4-T pixel by the optimization of electrical potential distribution under the transfer gate 被引量:2
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作者 李毅强 李斌桥 +3 位作者 徐江涛 高志远 徐超 孙羽 《Journal of Semiconductors》 EI CAS CSCD 2012年第12期31-36,共6页
The charge transfer efficiency improvement method is introduced by optimizing the electrical potential distribution under the transfer gate along the charge transfer path. A non-uniform doped transfer transistor chan-... The charge transfer efficiency improvement method is introduced by optimizing the electrical potential distribution under the transfer gate along the charge transfer path. A non-uniform doped transfer transistor chan- nel is introduced to provide an ascending electrical potential gradient in the transfer transistor channel. With the adjustments to the overlap length between the R1 region and the transfer gate, the doping dose of the R1 region, and the overlap length between the anti-punch-through (APT) implantations and transfer gate, the potential barrier and potential pocket in the connecting region of transfer transistor channel and the pinned photodiode (PPD) are reduced to improve the electrical potential connection. The simulation results show that the percentage of residual charges to total charges drops from 1/10^4 to 1/10^7, and the transfer time is reduced from 500 to 110 ns. This means the charge transfer efficiency is improved. 展开更多
关键词 CMOS image sensor charge transfer efficiency non-uniform doped transfer transistor channel potential barrier potential pocket
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