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Relation of V/III ratio of AlN interlayer with the polarity of nitride
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作者 Zhaole Su Yangfeng Li +8 位作者 Xiaotao Hu Yimeng Song Zhen Deng Ziguang Ma Chunhua Du Wenxin Wang Haiqiang Jia Yang Jiang Hong Chen 《Chinese Physics B》 SCIE EI CAS 2024年第11期417-421,共5页
N-polar GaN film was obtained by using a high-temperature AlN buffer layer.It was found that the polarity could be inverted by a thin low-temperature AlN interlayer with the same V/III ratio as that of the high-temper... N-polar GaN film was obtained by using a high-temperature AlN buffer layer.It was found that the polarity could be inverted by a thin low-temperature AlN interlayer with the same V/III ratio as that of the high-temperature AlN layer.Continuing to increase the V/III ratio of the low-temperature AlN interlayer,the Ga-polarity of GaN film was inverted to N-polarity again but the crystal quality and surface roughness of GaN film greatly deteriorated.Finally,we analyzed the chemical environment of the AlN layer by x-ray photoelectron spectroscopy(XPS),which provides a new direction for the control of GaN polarity. 展开更多
关键词 semiconductors III-V semiconductors chemistry of MOCVD and other vapor deposition methods
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