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Influence of low temperature on the surface deformation of deformable mirrors
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作者 尤俊成 官春林 周虹 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第5期215-223,共9页
The two factors which influence the low temperature performance of deformable mirrors(DMs) are the piezoelectric stroke of the actuators and the thermally induced surface deformation of the DM. A new theory was prop... The two factors which influence the low temperature performance of deformable mirrors(DMs) are the piezoelectric stroke of the actuators and the thermally induced surface deformation of the DM. A new theory was proposed to explain the thermally induced surface deformation of the DM: because the thermal strain between the actuators and the base leads to an additional moment according to the theory of plates, the base will be bent and the bowing base will result in an obvious surface deformation of the facesheet. The finite element method(FEM) was used to prove the theory. The results showed that the thermally induced surface deformation is mainly caused by the base deformation which is induced by the coefficient of thermal expansion(CTE) mismatching; when the facesheet has similar CTE with the actuators, the surface deformation of the DM would be smoother. Then an optimized DM design was adopted to reduce the surface deformation of the DMs at low temperature. The low temperature tests of two 61-element discrete PZT actuator sample deformable mirrors and the corresponding optimized DMs were conducted to verify the simulated results. The results showed that the optimized DMs perform well. 展开更多
关键词 mirrors thermally actuator piezoelectric verify explain interferometer compensate hollow Diameter
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Digital holographic shape measurement using Fizeau microscopy
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作者 D.G.Abdelsalam Junwei Min +1 位作者 Daesuk Kim Baoli Yao 《Chinese Optics Letters》 SCIE EI CAS CSCD 2015年第10期40-44,共5页
We present a Fizeau interferometer using a microscopic objective as a tool for surface contouring without the need for a numerical lens for reconstruction. The interferometer is associated with a telescope system to f... We present a Fizeau interferometer using a microscopic objective as a tool for surface contouring without the need for a numerical lens for reconstruction. The interferometer is associated with a telescope system to feature the object with collimated light. The experiment is conducted on two objects possessing different step heights.The phase maps from the captured off-axis holograms are calculated numerically, which allows us to deduce the contours of the objects. The great advantages of the presented technique are that it can be done in real time and there is no need for numerical lenses for micro-objects reconstruction. 展开更多
关键词 interferometer holographic captured reconstructed numerically microscopic Reconstruction compensate wavefront filtered
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Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry
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作者 谢孟璋 林俊佑 张家欧 《Chinese Optics Letters》 SCIE EI CAS CSCD 2016年第8期40-43,共4页
This Letter presents a method of an optical sensor for measuring wavelength shifts. The system consists of a diffraction grating and a total internal reflection heterodyne interferometer. As a heterodyne light beam st... This Letter presents a method of an optical sensor for measuring wavelength shifts. The system consists of a diffraction grating and a total internal reflection heterodyne interferometer. As a heterodyne light beam strikes a grating, the first-order diffraction beam is generated. The light penetrates into a total internal reflection prism at an angle larger than the critical angle. A wavelength variation will affect the diffractive angle of the first-order beam, thus inducing a phase difference variation of the light beam emerging from the total internal reflections inside the trapezoid prism. Both the experimental and theoretical results reveal that, for the first-order diffractive beam, the sensitivity and resolution levels are superior to 5°/nm and 0.006 nm, respectively, in the range of wavelength from 632 to 634 nm, and are superior to 3.1°/nm and 0.0095 nm in the range from 632 to 637 nm. For the theoretical simulation of the fourth-order diffractive beam, they are superior to 6.4 deg ∕nm and 0.0047 nm in the range from 632 to 637 nm. 展开更多
关键词 grating interferometry interferometer inducing fourth tunable mirror reflective emerging compensate
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