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Study of Inverse Lithography Approaches based on Deep Learning
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作者 Xianqiang Zheng Xu Ma +2 位作者 Shengen Zhang Yihua Pan Gonzalo RArce 《Journal of Microelectronic Manufacturing》 2020年第3期1-7,共7页
Computational lithography(CL)has become an indispensable technology to improve imaging resolution and fidelity of deep sub-wavelength lithography.The state-of-the-art CL approaches are capable of optimizing pixel-base... Computational lithography(CL)has become an indispensable technology to improve imaging resolution and fidelity of deep sub-wavelength lithography.The state-of-the-art CL approaches are capable of optimizing pixel-based mask patterns to effectively improve the degrees of optimization freedom.However,as the growth of data volume of photomask layouts,computational complexity has become a challenging problem that prohibits the applications of advanced CL algorithms.In the past,a number of innovative methods have been developed to improve the computational efficiency of CL algorithms,such as machine learning and deep learning methods.Based on the brief introduction of optical lithography,this paper reviews some recent advances of fast CL approaches based on deep learning.At the end,this paper briefly discusses some potential developments in future work. 展开更多
关键词 computational lithography inverse lithography technology(ILT) optical proximity correction(OPC) deep learning
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