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Quantitative micro-electrochemical study of duplex stainless steel 2205 in 3.5wt%NaCl solution 被引量:2
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作者 Shuangyu Cai Keke Lu +3 位作者 Xinnan Li Lei Wen Feifei Huang Ying Jin 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2022年第11期2053-2063,共11页
Duplex stainless steels(DSSs)are suffering from various localized corrosion attacks such as pitting,selective dissolution,crevice corrosion during their service period.It is of great value to quantitatively analyze an... Duplex stainless steels(DSSs)are suffering from various localized corrosion attacks such as pitting,selective dissolution,crevice corrosion during their service period.It is of great value to quantitatively analyze and grasp the micro-electrochemical corrosion behavior and related mechanism for DSSs on the micrometer or even smaller scales.In this work,scanning Kelvin probe force microscopy(SKPFM)and energy dispersive spectroscopy(EDS)measurements were performed to reveal the difference between the austenite phase and ferrite phase in microregion of DSS 2205.Then traditional electrochemical impedance spectroscopy(EIS)and potentiodynamic polarization(PDP)tests were employed for micro-electrochemical characterization of DSS 2205 with different proportion phases inϕ40 andϕ10μm micro holes.Both of them can only be utilized for qualitative or semi-quantitative micro-electrochemical characterization of DSS 2205.Coulostatic perturbation method was employed for quantitative micro-electrochemical characterization of DSS 2205.What is more,the applicable conditions of coulostatic perturbation were analyzed in depth by establishing a detailed electrochemical interface circuit.A series of microregion coulostatic perturbations for DSS 2205 with different proportion phases inϕ10μm micro holes showed that as the austenite proportion increases,the corresponding polarization resistance of microregion increases linearly. 展开更多
关键词 duplex stainless steel 2205 quantitative micro-electrochemical study electrochemical impedance spectroscopy coulostatic perturbation scanning Kelvin probe force microscopy
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