期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Estimating the Limits in System Design for 48 V Automotive Power Applications
1
作者 Ulf Schwalbe Marco Schilling Tobias Reimann 《Journal of Electrical Engineering》 2017年第2期100-113,共14页
The design process in power electronics is driven by increased utilisation level of the used components to gain performance whilst keeping cost low. This article provides an overview on challenges in low-voltage high-... The design process in power electronics is driven by increased utilisation level of the used components to gain performance whilst keeping cost low. This article provides an overview on challenges in low-voltage high-current systems, e.g. used in automotive applications. The main content points are: topology selection--single systems vs. cascaded systems, PCB manufacturing technology overview, current measurement methods, bulk capacitor design (ceramic DC link) and PCB design instructions for high-current systems. The PCB design instructions target on optimised thermal design for maximised PCB utilisation and on optimised track design for a low inductance DC link interconnection. The paper bases on calculations, measurements and simulations. 展开更多
关键词 High current application 48V system DC link optimization PCB optimization current carrying capability
下载PDF
A thick SOI UVLD LIGBT on partial membrane
2
作者 王卓 叶俊 +3 位作者 雷磊 乔明 张波 李肇基 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第2期57-60,共4页
A thick SOI LIGBT structure with a combination of uniform and variation in lateral doping profiles (UVLD) on partial membrane (UVLD PM LIGBT) is proposed. The silicon substrate under the drift region is selectivel... A thick SOI LIGBT structure with a combination of uniform and variation in lateral doping profiles (UVLD) on partial membrane (UVLD PM LIGBT) is proposed. The silicon substrate under the drift region is selectively etched to remove the charge beneath the buried oxide so that the potential lines can release below the membrane, resulting in an enhanced breakdown voltage. Moreover, the thick SOI LIGBT with the advantage of a large current flowing and a thermal diffusing area achieves a strong current carrying capability and a low junction temperature. The current carrying capability (VAnode = 6 V, VGate = 15 V) increases by 16% and the maximal junction temperature (1 mW/μm) decreases by 30 K in comparison with that of a conventional thin SO1 structure. 展开更多
关键词 SOI LIGBT UVLD partial membrane current carrying capability junction temperature
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部