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New Curvature-Compensated CMOS Bandgap Voltage Reference 被引量:4
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作者 Lu Shen Ning Ning Qi Yu Yan Luo Chun-Sheng Li 《Journal of Electronic Science and Technology of China》 2007年第4期370-373,共4页
A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp... A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp bipolar transistor. The proposed circuit, designed in a standard 0.18 μm CMOS process, achieves a good temperature coefficient of 2.44 ppm/℃ with temperature range from --40℃ to 85 ℃, and about 4 mV supply voltage variation in the range from 1.4 V to 2.4 V. With a 1.8 V supply voltage, the power supply rejection ratio is -56dB at 10MHz. 展开更多
关键词 Bandgap voltage reference CMOS curvature-compensation technique finite current gain.
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A novel low-voltage high precision current reference based on subthreshold MOSFETs 被引量:1
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作者 YU Guo-yi ZOU Xue-eheng 《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 SCIE EI CAS CSCD 2007年第1期50-55,共6页
A novel topology low-voltage high precision current reference based on subthreshold Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) is presented. The circuit achieves a temperature-independent reference... A novel topology low-voltage high precision current reference based on subthreshold Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) is presented. The circuit achieves a temperature-independent reference current by a proper combination current of two first-order temperature-compensation current references, which exploit the temperature characteristics of integrated poly2 resistors and the 1- V transconductance characteristics of MOSFET operating in the subthreshold region. The circuit, designed with the 1 st silicon 0.35 μm standard CMOS logic process technology, exhibits a stable current of about 2.25 μA with much low temperature coefficient of 3 × 10^-4μA/℃ in the temperature range of-40-150 ℃ at 1 V supply voltage, and also achieves a better power supply rejection ratio (PSRR) over a broad frequency. The PSRR is about -78 dB at DC and remains -42 dB at the frequency higher than 10 MHz. The maximal process error is about 6,7% based on the Monte Carlo simulation. So it has good process compatibility. 展开更多
关键词 Current reference curvature-compensation Low voltage SUBTHRESHOLD CMOS integrated circuit
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A high precision high PSRR bandgap reference with thermal hysteresis protection 被引量:3
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作者 杨银堂 李娅妮 朱樟明 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第9期113-117,共5页
To meet the accuracy requirement for the bandgap voltage reference by the increasing data conversion precision of integrated circuits,a high-order curvature-compensated bandgap voltage reference is presented employing... To meet the accuracy requirement for the bandgap voltage reference by the increasing data conversion precision of integrated circuits,a high-order curvature-compensated bandgap voltage reference is presented employing the characteristic of bipolar transistor current gain exponentially changing with temperature variations.In addition,an over-temperature protection circuit with a thermal hysteresis function to prevent thermal oscillation is proposed.Based on the CSMC 0.5μm 20 V BCD process,the designed circuit is implemented;the active die area is 0.17×0.20 mm;. Simulation and testing results show that the temperature coefficient is 13.7 ppm/K with temperature ranging from -40 to 150℃,the power supply rejection ratio is -98.2 dB,the line regulation is 0.3 mV/V,and the power consumption is only 0.38 mW.The proposed bandgap voltage reference has good characteristics such as small area,low power consumption, good temperature stability,high power supply rejection ratio,as well as low line regulation.This circuit can effectively prevent thermal oscillation and is suitable for on-chip voltage reference in high precision analog,digital and mixed systems. 展开更多
关键词 bandgap voltage reference curvature-compensated power supply rejection ratio over-temperature protection BCD process
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Negative voltage bandgap reference with multilevel curvature compensation technique 被引量:1
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作者 刘溪 刘倩 +2 位作者 靳哓诗 赵永瑞 李宗昊 《Journal of Semiconductors》 EI CAS CSCD 2016年第5期114-120,共7页
A novel high-order curvature compensation negative voltage bandgap reference (NBGR) based on a novel multilevel compensation technique is introduced. Employing an exponential curvature compensation (ECC) term with... A novel high-order curvature compensation negative voltage bandgap reference (NBGR) based on a novel multilevel compensation technique is introduced. Employing an exponential curvature compensation (ECC) term with many high order terms in itself, in a lower temperature range (TR) and a multilevel curvature compen- sation (MLCC) term in a higher TR, a flattened and better effect of curvature compensation over the TR of 165℃ (--40 to 125 ℃) is realised. The MLCC circuit adds two convex curves by using two sub-threshold operated NMOS. The proposed NBGR implemented in the Central Semiconductor Manufacturing Corporation (CSMC) 0.5 #m BCD technology demonstrates an accurate voltage of-1.183 V with a temperature coefficient (TC) as low as 2.45 ppm/℃over the TR of 165℃ at a -5.0 V power supply; the line regulation is 3 mV/V from a -5 to -2 V supply voltage. The active area of the presented NBGR is 370×180 μm2. 展开更多
关键词 negative voltage bandgap reference ECC multilevel curvature-compensation TC line regulation
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