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Studies on morphology, electrical and optical characteristics of Al-doped ZnO thin films grown by atomic layer deposition 被引量:1
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作者 Li Chen Xinliang Chen +3 位作者 Zhongxin Zhou Sheng Guo Ying Zhao Xiaodan Zhang 《Journal of Semiconductors》 EI CAS CSCD 2018年第3期19-24,共6页
Al doped ZnO(AZO) films deposited on glass substrates through the atomic layer deposition(ALD)technique are investigated with various temperatures from 100 to 250 °C and different Zn : Al cycle ratios from20... Al doped ZnO(AZO) films deposited on glass substrates through the atomic layer deposition(ALD)technique are investigated with various temperatures from 100 to 250 °C and different Zn : Al cycle ratios from20 : 0 to 20 : 3. Surface morphology, structure, optical and electrical properties of obtained AZO films are studied in detail. The Al composition of the AZO films is varied by controlling the ratio of Zn : Al. We achieve an excellent AZO thin film with a resistivity of 2.14 × 10^(-3)Ω·cm and high optical transmittance deposited at 150 °C with20 : 2 Zn : Al cycle ratio. This kind of AZO thin films exhibit great potential for optoelectronics device application. 展开更多
关键词 AZO films ALD Zn:Al cycle ratio optical and electrical properties
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