In view of drastic possible changes in fuze environment tempera- ture,a kind of temperature autocompensated detecting circuit for the capaci- tance fuze is proposed.It provides a steady detected output when the envi- ...In view of drastic possible changes in fuze environment tempera- ture,a kind of temperature autocompensated detecting circuit for the capaci- tance fuze is proposed.It provides a steady detected output when the envi- ronment temperature varies from-50℃ to 65℃ and keeps a stable detecting sensitivity.Based on an analysis of the circuit,influence of the major param- eters of the oscillating circuit on the amplitude are explored.A few impor- tant controllable parameters affecting the circuit feature are found out.A parameter-control method is given in order to improve the circuit perfor- mance.展开更多
To reduce the pressure on contacts and circuit breaker and realize the zone selective interlocking (ZSI) function above the instantaneous protection threshold (e.g., >10In), the short circuit current needs to be ea...To reduce the pressure on contacts and circuit breaker and realize the zone selective interlocking (ZSI) function above the instantaneous protection threshold (e.g., >10In), the short circuit current needs to be early detected. The state-of–art of early short circuit detection (ESCD) method is reviewed. Based on the equivalent model of the short circuit, a new method based on the current and its integration is proposed. The prospective current value can be detected in the early stage of the short circuit. According to the evaluation result, the short circuit current can be early forecasted with the proposed method.展开更多
According to the characteristics of single-phase circuits and demand of using active filter for real-time detecting harmonic and reactive currents, a detecting method based on Fryze＇s power definition is proposed. Th...According to the characteristics of single-phase circuits and demand of using active filter for real-time detecting harmonic and reactive currents, a detecting method based on Fryze＇s power definition is proposed. The results of theoretical analysis and simula- tion show that the proposed method is effective in realtime detecting of instantaneous harmonic and reactive currents in single-phase circuits. When only detecting the total reactive currents, this method does not need a phase-locked loop circuit, and it also can be used in some special applications to provide different compensations on the ground of different requirements of electric network. Compared with the other methods based on the theory of instantaneous reactive power, this method is simple and easy to realize.展开更多
The integrated circuit chip with high performance has a high sensitivity to the defects in manufacturing environments.When there are defects on a wafer,the defects may lead to the degradation of chip performance.It is...The integrated circuit chip with high performance has a high sensitivity to the defects in manufacturing environments.When there are defects on a wafer,the defects may lead to the degradation of chip performance.It is necessary to design effective detection approaches for the defects in order to ensure the reliability of wafer.In this paper,a new method based on image boundary extraction is presented for the detection of defects on a wafer.The method uses island model genetic algorithms to perform the segmentation of wafer images,and gets the optimal threshold values.The island model genetic algorithm uses two distinct subpopulations,it is a coarse grain parallel model.The individuals migration can occur between the two subpopulations to share genetic materials.A lot of experimental results show that the defect detection method proposed in this paper can obtain the features of defects effectively.展开更多
文摘In view of drastic possible changes in fuze environment tempera- ture,a kind of temperature autocompensated detecting circuit for the capaci- tance fuze is proposed.It provides a steady detected output when the envi- ronment temperature varies from-50℃ to 65℃ and keeps a stable detecting sensitivity.Based on an analysis of the circuit,influence of the major param- eters of the oscillating circuit on the amplitude are explored.A few impor- tant controllable parameters affecting the circuit feature are found out.A parameter-control method is given in order to improve the circuit perfor- mance.
文摘To reduce the pressure on contacts and circuit breaker and realize the zone selective interlocking (ZSI) function above the instantaneous protection threshold (e.g., >10In), the short circuit current needs to be early detected. The state-of–art of early short circuit detection (ESCD) method is reviewed. Based on the equivalent model of the short circuit, a new method based on the current and its integration is proposed. The prospective current value can be detected in the early stage of the short circuit. According to the evaluation result, the short circuit current can be early forecasted with the proposed method.
文摘According to the characteristics of single-phase circuits and demand of using active filter for real-time detecting harmonic and reactive currents, a detecting method based on Fryze＇s power definition is proposed. The results of theoretical analysis and simula- tion show that the proposed method is effective in realtime detecting of instantaneous harmonic and reactive currents in single-phase circuits. When only detecting the total reactive currents, this method does not need a phase-locked loop circuit, and it also can be used in some special applications to provide different compensations on the ground of different requirements of electric network. Compared with the other methods based on the theory of instantaneous reactive power, this method is simple and easy to realize.
基金supported by Guangdong Provincial Natural Science Foundation of China (7005833)
文摘The integrated circuit chip with high performance has a high sensitivity to the defects in manufacturing environments.When there are defects on a wafer,the defects may lead to the degradation of chip performance.It is necessary to design effective detection approaches for the defects in order to ensure the reliability of wafer.In this paper,a new method based on image boundary extraction is presented for the detection of defects on a wafer.The method uses island model genetic algorithms to perform the segmentation of wafer images,and gets the optimal threshold values.The island model genetic algorithm uses two distinct subpopulations,it is a coarse grain parallel model.The individuals migration can occur between the two subpopulations to share genetic materials.A lot of experimental results show that the defect detection method proposed in this paper can obtain the features of defects effectively.
