期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Finding Data Tractable Description Logics for Computing a Minimum Cost Diagnosis Based on ABox Decomposition
1
作者 杜剑峰 漆桂林 Jeff Z.Pan 《Tsinghua Science and Technology》 SCIE EI CAS 2010年第6期623-632,共10页
Ontology diagnosis, a well-known approach for handling inconsistencies in a description logic (DL) based ontology, computes a diagnosis of the ontology, i.e., a minimal subset of axioms in the ontology whose removal... Ontology diagnosis, a well-known approach for handling inconsistencies in a description logic (DL) based ontology, computes a diagnosis of the ontology, i.e., a minimal subset of axioms in the ontology whose removal restores consistency. However, ontology diagnosis is computationally hard, especially computing a minimum cost diagnosis (MCD) which is a diagnosis such that the sum of the removal costs attached to its axioms is minimized. This paper addresses this problem by finding data tractable DLs for computing an MCD which allow computing an MCD in time polynomial in the size of the ABox of a given ontology. ABox decomposition is used to find a sufficient and necessary condition to identify data tractable DLs for computing an MCD under the unique name assumption (UNA) among all fragments of that are at least as expressive as without inverse roles. The most expressive, data tractable DL identified is without inverse roles or qualified existential restrictions. 展开更多
关键词 ontology diagnosis minimum cost diagnosis description logics data tractability
原文传递
Test sequencing problem arising at the design stage for reducing life cycle cost 被引量:3
2
作者 Zhang Shigang Hu Zheng Wen Xisen 《Chinese Journal of Aeronautics》 SCIE EI CAS CSCD 2013年第4期1000-1007,共8页
Previous test sequencing algorithms only consider the execution cost of a test at the application stage. Due to the fact that the placement cost of some tests at the design stage is considerably high compared with the... Previous test sequencing algorithms only consider the execution cost of a test at the application stage. Due to the fact that the placement cost of some tests at the design stage is considerably high compared with the execution cost, the sequential diagnosis strategy obtained by previous methods is actually not optimal from the view of life cycle. In this paper, the test sequencing problem based on life cycle cost is presented. It is formulated as an optimization problem, which is non-deterministic polynomial-time hard (NP-hard). An algorithm and a strategy to improve its computational efficiency are proposed. The formulation and algorithms are tested on various simulated systems and comparisons are made with the extant test sequencing methods. Application on a pump rotational speed control (PRSC) system of a spacecraft is studied in detail. Both the simulation results and the real-world case application results suggest that the solution proposed in this paper can significantly reduce the life cycle cost of a sequential fault diagnosis strategy. 展开更多
关键词 AND/OR graph Heuristic search Life cycle cost Sequential fault diagnosis Test sequencing problem
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部