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Analytical evaluation of steady-state solute distribution in through- diffusion and membrane behavior test under non-perfectly flushing boundary conditions
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作者 Guannian Chen Yuchao Li +1 位作者 Kristin MSample-Lord Shan Tong 《Journal of Rock Mechanics and Geotechnical Engineering》 SCIE CSCD 2024年第1期258-267,共10页
The through-diffusion and membrane behavior testing procedure using a closed-system apparatus has been widely used for concurrent measurement of diffusion and membrane efficiency coefficients of low-permeability clay-... The through-diffusion and membrane behavior testing procedure using a closed-system apparatus has been widely used for concurrent measurement of diffusion and membrane efficiency coefficients of low-permeability clay-based barrier materials.However,the common assumption of perfectly flushing conditions at the specimen boundaries could induce errors in analyses of the diffusion coefficients and membrane efficiencies.In this study,an innovative pseudo three-dimensional(3D)analytical method was proposed to evaluate solute distribution along the boundary surfaces of the soil-porous disks system,considering the non-perfectly flushing conditions.The results were consistent with numerical models under two scenarios considering different inflow/outflow positions.The proposed model has been demonstrated to be an accurate and reliable method to estimate solute distributions along the bound-aries.The calculated membrane efficiency coefficient and diffusion coefficient based on the proposed analytical method are more accurate,resulting in up to 50%less relative error than the traditional approach that adopts the arithmetic mean value of the influent and effluent concentrations.The retar-dation factor of the clay specimen also can be calculated with a revised cumulative mass approach.Finally,the simulated transient solute transport matched with experimental data from a multi-stage through-diffusion and membrane behavior test,validating the accuracy of the proposed method. 展开更多
关键词 diffusion testing Membrane behavior Coupled transport Clay barrier Transport modeling
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Effective Diffusion Energy Barriers with the Boltzmann Distribution Assumption 被引量:1
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作者 TU Rui WANG Zhu 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2019年第1期1-5,共5页
We derived revised effective diffusion energy barriers following the Boltzmann distribution assumption for impurity atoms in a bulk material under the impact of various kinds of point defects to reveal the insights of... We derived revised effective diffusion energy barriers following the Boltzmann distribution assumption for impurity atoms in a bulk material under the impact of various kinds of point defects to reveal the insights of migration mechanisms. The effective diffusion energy barriers of copper impurities in bulk zirconium were calculated through the first principle method under the presented hypothesis. Our results(?E_(||) =1.27 eV, ?E_⊥=1.31 eV) agreed well with the experimental results(?E_(||) =1.54 eV, ?E_⊥=1.60 eV), which validated bulk diffusion as the major mechanism for copper diffusion in zirconium. The effective diffusion energy barriers could be used for estimating whether the defects will accelerate the diffusion or slow them down by acting as traps of the impurity atoms. On the other hand, the first principle results of the impurity diffusion via defects could be further used as inputs of larger scale computational simulations, such as MC(Monte Carlo) or Phase Field calculations. 展开更多
关键词 BOLTZMANN distribution diffusion energy barrier point defect first PRINCIPLE calculation NEB method
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The Effect of Diffusion Barrier and Bombardment on Adhesive Strength of CuCr Alloy Films 被引量:1
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作者 WANGJian-feng SONGZhong-xiao +1 位作者 XUKe-wei WANGYuan 《材料热处理学报》 EI CAS CSCD 北大核心 2004年第05B期875-878,共4页
A novel co-sputtering method that combined magnetron sputtering (MS) with ion beam sputtering (IBS) was used to fabricate CuCr alloy films without breaking vacuum after depositing diffusion barrier with IBS. Different... A novel co-sputtering method that combined magnetron sputtering (MS) with ion beam sputtering (IBS) was used to fabricate CuCr alloy films without breaking vacuum after depositing diffusion barrier with IBS. Different bombardment energies were used to improve the comprehensive properties of Cu alloy film. The results indicated that the effects of diffusion barriers and bombardment energy on adhesive strength could be evaluated by a rolling contact fatigue adhesion test. Diffusion barrier can enhance the adhesive strength, and the adhesion of CuCr/CrN was higher than that of CuCr/TiN. When bombarding energy was higher, the adhesive strength of CuCr/TiN films was higher due to the broader transition zone. 展开更多
关键词 CUCR合金 扩散势垒 粘合强度 离子束溅射 磁控管溅射
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Feasibility of compacted attapulgite/diatomite amended clayey soils as gas barrier materials
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作者 Heng Zhuang Wei-Yi Xia +5 位作者 Jia-Ming Wen Min Wang Ying-Zhen Li Ning-Jun Jiang Konstantin S.Rodygin Yan-Jun Du 《Journal of Rock Mechanics and Geotechnical Engineering》 SCIE CSCD 2024年第9期3707-3717,共11页
Compacted clay liners are extensively used as barriers to control the upward diffusion of vapors of volatile or semi-volatile organic contaminants released from unsaturated contaminated soils at industrycontaminated s... Compacted clay liners are extensively used as barriers to control the upward diffusion of vapors of volatile or semi-volatile organic contaminants released from unsaturated contaminated soils at industrycontaminated sites.This study aimed to investigate the gas diffusion barrier performance of compacted clayey soils amended with three agents including attapulgite and diatomite individually,and attapulgite/diatomite mixture.The properties including water retention,volumetric shrinkage,gas diffusion,and unconfined compressive strength were evaluated through a series of laboratory tests of amended compacted clayey soils.The results demonstrate that the decrease in volume proportions of interaggregate pores leads to an increase in unconfined compressive strength(qu).Both hydrophilic groups and microstructures of attapulgite and diatomite result in an increase in water retention percent(Wt)of compacted clayey soil specimens after amendment regardless of the type of agent or initial water content(w0).Furthermore,the ratio of the gas diffusion coefficient(De)to the gas diffusion coefficient in the air(Da)was significantly reduced owing to a decrease in volume proportions of inter-aggregate pores,hydrophilic group,and microstructures of attapulgite and diatomite.Scanning electron microscope analyses revealed that rod-shaped attapulgite filled the inter-aggregate pores formed by clay particles,whereas the disc-shaped diatomite particles,characterized by micropores,failed to obstruct the interaggregate pores due to their larger particle size.Mercury intrusion porosimetry(MIP)analyses showed a reduction in pore volume in the inter-aggregate pores,leading to a reduction in the total pore volume for both the attapulgite and attapulgite/diatomite mixture amended clays,which is in accordance with the scanning electron microscope(SEM)results.The findings are pertinent to the practical application of compacted clay liners as gas barriers against the upward migration of volatile or semi-volatile organic contaminants at contaminated sites. 展开更多
关键词 Compacted clay liner Attapulgite/diatomite mixture diffusion barrier Water retention
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Study of three-dimensional spatial diffuse discharge in contact electrode structure applied to air purification
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作者 Shuai XU Wenzheng LIU +3 位作者 Jiaying QIN Yiwei SUN Xitao JIANG Qi QI 《Plasma Science and Technology》 SCIE EI CAS CSCD 2024年第10期73-81,共9页
In this work,based on the role of pre-ionization of the non-uniform electric field and its effect of reducing the collisional ionization coefficient,a diffuse dielectric barrier discharge plasma is formed in the open ... In this work,based on the role of pre-ionization of the non-uniform electric field and its effect of reducing the collisional ionization coefficient,a diffuse dielectric barrier discharge plasma is formed in the open space outside the electrode structure at a lower voltage by constructing a three-dimensional non-uniform spatial electric field using a contact electrode structure.The air purification study is also carried out.Firstly,a contact electrode structure is constructed using a three-dimensional wire electrode.The distribution characteristics of the spatial electric field formed by this electrode structure are analyzed,and the effects of the non-uniform electric field and the different angles of the vertical wire on the generation of three-dimensional spatial diffuse discharge are investigated.Secondly,the copper foam contact electrode structure is constructed using copper foam material,and the effects of different mesh sizes on the electric field distribution are analyzed.The results show that as the mesh size of the copper foam becomes larger,a strong electric field region exists not only on the surface of the insulating layer,but also on the surface of the vertical wires inside the copper foam,i.e.,the strong electric field region shows a three-dimensional distribution.Besides,as the mesh size increases,the area of the vertical strong electric field also increases.However,the electric field strength on the surface of the insulating layer gradually decreases.Therefore,the appropriate mesh size can effectively increase the discharge area,which is conducive to improving the air purification efficiency.Finally,a highly permeable stacked electrode structure of multilayer wire-copper foam is designed.In combination with an ozone treatment catalyst,an air purification device is fabricated,and the air purification experiment is carried out. 展开更多
关键词 dielectric barrier discharge three-dimensional spatial discharge atmospheric pressure air diffusion discharge air purification
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Preparation and properties of SiCN diffusion barrier layer for Cu interconnect in ULSI 被引量:1
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作者 周继承 石之杰 郑旭强 《中国有色金属学会会刊:英文版》 CSCD 2009年第3期611-615,共5页
SiCN thin films and Cu/SiCN/Si structures were fabricated by magnetron sputtering. And some samples underwent the rapid thermal annealing(RTA) processing. The thin-film surface morphology, crystal structure and electr... SiCN thin films and Cu/SiCN/Si structures were fabricated by magnetron sputtering. And some samples underwent the rapid thermal annealing(RTA) processing. The thin-film surface morphology, crystal structure and electronic properties were characterized by atomic force microscopy(AFM), X-ray diffractometry(XRD), Fourier transform infrared transmission(FTIR) and four-point probe(FPP) analyses. The results reveal the formation of complex networks among the three elements, Si, C and N, and the existence of different chemical bonds in the SiCN films, such as Si—C, Si—N, C—N and C=N. The as-deposited SiCN thin films are amorphous in the Cu/SiCN/Si structures and have good thermal stability, and the SiCN thin films are still able to prevent the diffusion reaction between Cu and Si interface after RTA processing at 600 ℃ for 5 min. 展开更多
关键词 超大规模集成电路 扩散反应 铜互连 制备 SiCN薄膜 阻隔层 X射线衍射 性能
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EFFECT OF METAL-OXIDE DIFFUSION BARRIER ON INTERDIFFUSION OF ELEMENTS BETWEEN COATING AND SUBSTRATE
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作者 SUN Biwu GUAN Hengrong SUN Xiaofeng (Institute of Metal Research,Academia Sinica,Shenyang)LI Tiefan (Institute of Corrosion and Protection of Metals,Academia Sinica,Shenyang) 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1991年第9期174-178,共5页
The effect of LPPS Ni_3Al-Y_2O_3 diffusion barrier layer on interdiffusion of elements between coating and substrate has been investigated.It was found that the retardation of interdiffusion is related to the amount o... The effect of LPPS Ni_3Al-Y_2O_3 diffusion barrier layer on interdiffusion of elements between coating and substrate has been investigated.It was found that the retardation of interdiffusion is related to the amount of oxide in the diffusion barrier layer.The retardation is not remark- able when the content of Y_2O_3 is 8 wt-%,whereas the diffusion of Al,Co or Cr has all been notably retarded when the content of Y_2O_3 reaches 30 wt-%.The retardation effect of diffu- sion barrier is different for different elements such as Al,Co or Cr. 展开更多
关键词 COATING diffusion barrier diffusion
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Beryllium carbide as diffusion barrier against Cu:First-principles study
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作者 Hua-Liang Cao Xin-Lu Cheng Hong Zhang 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第1期387-392,共6页
Beryllium carbide is used in inertial confinement fusion(ICF)capsule ablation material due to its low atomic number,low opacity,and high melting point properties.We used the method of climbing image nudged elastic ban... Beryllium carbide is used in inertial confinement fusion(ICF)capsule ablation material due to its low atomic number,low opacity,and high melting point properties.We used the method of climbing image nudged elastic band(CINEB)to calculate the diffusion barrier of copper atom in the crystal of beryllium and beryllium carbide.The diffusion barrier of copper atom in crystal beryllium is only 0.79 eV,and the barrier in beryllium carbide is larger than 2.85 eV.The three structures of beryllium carbide:anti-fluorite Be2C,Be2C-Ⅰ,and Be2C-Ⅲhave a good blocking effect to the diffusion of copper atom.Among them,the Be2C-Ⅲstructure has the highest diffusion barrier of 6.09 eV.Our research can provide useful help for studying Cu diffusion barrier materials. 展开更多
关键词 diffusion barrier beryllium carbide adsorption energy
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Hyper-exponential jump-diffusion model under the barrier dividend strategy 被引量:1
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作者 DONG Ying-hui CHEN Yao ZHU Hai-fei 《Applied Mathematics(A Journal of Chinese Universities)》 SCIE CSCD 2015年第1期17-26,共10页
In this paper, we consider a hyper-exponential jump-diffusion model with a constant dividend barrier. Explicit solutions for the Laplace transform of the ruin time, and the Gerber- Shiu function are obtained via marti... In this paper, we consider a hyper-exponential jump-diffusion model with a constant dividend barrier. Explicit solutions for the Laplace transform of the ruin time, and the Gerber- Shiu function are obtained via martingale stopping. 展开更多
关键词 reflected jump-diffusion process barrier strategy ruin time Gerber-Shiu function hyper-exponential distribution.
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Numerical Methods for Discrete Double Barrier Option Pricing Based on Merton Jump Diffusion Model
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作者 Mingjia Li 《Open Journal of Statistics》 2017年第3期446-458,共13页
As a kind of weak-path dependent options, barrier options are an important kind of exotic options. Because the pricing formula for pricing barrier options with discrete observations cannot avoid computing a high dimen... As a kind of weak-path dependent options, barrier options are an important kind of exotic options. Because the pricing formula for pricing barrier options with discrete observations cannot avoid computing a high dimensional integral, numerical calculation is time-consuming. In the current studies, some scholars just obtained theoretical derivation, or gave some simulation calculations. Others impose underlying assets on some strong assumptions, for example, a lot of calculations are based on the Black-Scholes model. This thesis considers Merton jump diffusion model as the basic model to derive the pricing formula of discrete double barrier option;numerical calculation method is used to approximate the continuous convolution by calculating discrete convolution. Then we compare the results of theoretical calculation with simulation results by Monte Carlo method, to verify their efficiency and accuracy. By comparing the results of degeneration constant parameter model with the results of previous models we verified the calculation method is correct indirectly. Compared with the Monte Carlo simulation method, the numerical results are stable. Even if we assume the simulation results are accurate, the time consumed by the numerical method to achieve the same accuracy is much less than the Monte Carlo simulation method. 展开更多
关键词 DISCRETE DOUBLE barrier OPTION MERTON JUMP diffusion Model DISCRETE Convolution Monte Carlo Method
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Diffusion barrier performance of nanoscale TaN_x thin-film
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作者 周继承 陈海波 李幼真 《中国有色金属学会会刊:英文版》 EI CSCD 2007年第4期733-738,共6页
TaNx nanoscale thin-films and Cu/TaNx multilayer structures were deposited on P-type Si(100) substrates by DC reactive magnetron sputtering. The characteristics of TaNx films and thermal stabilities of Cu/TaNx/Si syst... TaNx nanoscale thin-films and Cu/TaNx multilayer structures were deposited on P-type Si(100) substrates by DC reactive magnetron sputtering. The characteristics of TaNx films and thermal stabilities of Cu/TaNx/Si systems annealed at various temperatures were studied by four-point probe(FPP) sheet resistance measurement, atomic force microscopy(AFM), scanning electron microscope-energy dispersive spectrum (SEM-EDS), Alpha-Step IQ Profilers and X-ray diffraction(XRD), respectively. The results show that the surfaces of deposited TaNx thin-films are smooth. With the increasing of N2 partial pressure, the deposition rate and root-mean-square(RMS) decrease, while the content of N and sheet resistance of the TaNx thin-films increase, and the diffusion barrier properties of TaNx thin-films is improved. TaN1.09 can prevent interdiffusion between Cu and Si effectively after annealing up to 650 ℃ for 60 s. The failure of TaNx is mainly attributed to the formation of Cu3Si on TaN/Si interface, which results from Cu diffusion along the grain boundaries of polycrystalline TaN. 展开更多
关键词 活性磁控溅射 纳米材料 钽氮薄膜 铜扩散 扩散势垒区
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The modulation of Schottky barrier height of NiSi/n-Si Schottky diodes by silicide as diffusion source technique
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作者 安霞 范春晖 +4 位作者 黄如 郭岳 徐聪 张兴 王阳元 《Chinese Physics B》 SCIE EI CAS CSCD 2009年第10期4465-4469,共5页
This paper reports that the Schottky barrier height modulation of NiSi/n-Si is experimentally investigated by adopting a novel silicide-as-diffusion-source technique, which avoids the damage to the NiSi/Si interface i... This paper reports that the Schottky barrier height modulation of NiSi/n-Si is experimentally investigated by adopting a novel silicide-as-diffusion-source technique, which avoids the damage to the NiSi/Si interface induced from the conventional dopant segregation method. In addition, the impact of post-BF2 implantation after silicidation on the surface morphology of Ni silicides is also illustrated. The thermal stability of Ni silicides can be improved by silicide- as-diffusion-source technique. Besides, the electron Schottky barrier height is successfully modulated by 0.11 eV at a boron dose of 1015 cm-2 in comparison with the non-implanted samples. The change of barrier height is not attributed to the phase change of silicide films but due to the boron pile-up at the interface of NiSi and Si substrate which causes the upward bending of conducting band. The results demonstrate the feasibility of novel silicide-as-diffusion-source technique for the fabrication of Schottky source/drain Si MOS devices. 展开更多
关键词 Schottky barrier height silicide-as-diffusion source Ni silicide
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Effect of Annealing Ambience on the Chemical Stability of Zr-Si-N Diffusion Barrier
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作者 SONGZhong-xiao WANGYuan +1 位作者 XUKe-wei LIUChun-liang 《材料热处理学报》 EI CAS CSCD 北大核心 2004年第05B期1225-1228,共4页
Zr-Si-N films were deposited by RF magnetron sputtering (MS) technique. A Cu film on the top of Zr-Si-N films was prepared by DC pulsed magnetron sputtering. The Cu/Zr-Si-N systems were annealed in vacuum and N2/H2 ga... Zr-Si-N films were deposited by RF magnetron sputtering (MS) technique. A Cu film on the top of Zr-Si-N films was prepared by DC pulsed magnetron sputtering. The Cu/Zr-Si-N systems were annealed in vacuum and N2/H2 gas mixture at 800°C, respectively. The structure of the films were characterized by X-ray diffraction (XRD), Auger electron spectroscopy (AES) and four-point probe method. The sheet resistances of the Cu/Zr-Si-N/Si contact systems annealed in N2/H2 gas mixture were lower than those of the specimens annealed in vacuum at 800°C. The residual oxygen contamination from vacuum annealing ambience influences the sheet resistances of the Cu/Zr-Si-N/Si contact systems due to residual oxygen contamination and/or voids in Cu films. Though thermal stabilities of the Cu/Zr-Si-N/Si systems were maintained up to 800°C when annealed in vacuum and N2/H2 gas mixture, the changes of thermal stability of specimens were noticeable. The vacuum can accelerate the oxidation and decomposition of Zr-Si-N barrier. On the contrary, N2/H2 gas mixture prevent from the Zr-Si-N barrier oxidation and decomposition. 展开更多
关键词 扩散势垒 Zr-Si-N 退火 化学稳定性
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Interface Reaction of SiO_2/Ta and Its Influence on Cu Diffusion 被引量:1
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作者 龙世兵 马纪东 +4 位作者 于广华 赵洪辰 朱逢吾 张国海 夏洋 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第10期1046-1050,共5页
Ta/NiFe film is deposited on Si substrate precoated with SiO_2 by magnetron sputtering.SiO_2/Ta interface and Ta_5Si_3 standard sample are investigated by using X-ray photoelectron spectroscopy (XPS) and peak decompos... Ta/NiFe film is deposited on Si substrate precoated with SiO_2 by magnetron sputtering.SiO_2/Ta interface and Ta_5Si_3 standard sample are investigated by using X-ray photoelectron spectroscopy (XPS) and peak decomposition technique.The results show that there is a thermodynamically favorable reaction at the SiO_2/Ta interface:37Ta+15SiO_2=5Ta_5Si_3+6Ta_2O_5.The more stable products Ta_5Si_3 and Ta_2O_5 may be beneficial to stop the diffusion of Cu into SiO_2. 展开更多
关键词 copper interconnection in ULSI diffusion barrier interface reaction X-ray photoelectron spectroscopy
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Influence of Annealing on the Grain Growth and Thermal Diffusivity of Nanostructured YSZ Thermal Barrier Coating 被引量:2
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作者 Na WANG Chungen ZHOU Shengkai GONG Huibin XU 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2006年第6期793-797,共5页
The nanostructured zirconia coatings were deposited by atmospherically plasma spraying. Scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray diffraction were used to investigate the... The nanostructured zirconia coatings were deposited by atmospherically plasma spraying. Scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray diffraction were used to investigate the microstructure of the zirconia coatings. Thermal diffusivity values at normal temperatures have been evaluated by laser flash technique. Effect of annealing on the microstructure evolution of the zirconia coating has been performed. The grains and thermal diffusivity are increased with increasing annealing time and temperature. The grain growth is according to the GRIGC (the grain rotation induced grain coalescence) mechanism. The increase in thermal diffusivity is attributed to the grain growth and the decrease in porosity of nanostructured zirconia coatings. 展开更多
关键词 Grain size Thermal diffusivity Thermal barrier coating Plasma spraying
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THE INFLUENCE OF Mo DIFFUSION ON THE THERMAL BEHAVIOR OF TBCs ON Ni_3Al BASED ALLOY IC-6 被引量:2
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作者 D.B. Zhang S.K. Gong +1 位作者 H.B. Xu Y.F. Han 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2002年第1期45-48,共4页
Conventional two-layered structure thermal barrier coatings (TBCs) were prepared onto γ'-Ni3Al based alloy IC-6 by electron beam physical vapor deposition (EB-PVD). Isothermal oxidation and thermal cycling tests ... Conventional two-layered structure thermal barrier coatings (TBCs) were prepared onto γ'-Ni3Al based alloy IC-6 by electron beam physical vapor deposition (EB-PVD). Isothermal oxidation and thermal cycling tests were carried out to investigate the effect of Mo content at the interface between bond coat and ceramic top coat caused by diffusion. It has been found that the alloy coated with TBCs presented the lowest oxidation weight gain value for the reason that the ceramic top coat in TBC system can effectively stop Mo oxides evaporating. The life time of TBCs has close relation with Mo content at the interface between the bond coat and top coat. Spaliation of ceramic top coat occurred during thermal cyclic testing when Mo atoms accumulated at the interface up to certain amount to decline the combination between the bond coat and top coat. 展开更多
关键词 EB-PVD thermal barrier coatings (TBCs) thermal cyclic diffusion
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The apparent diffusion coefficient does not reflect cytotoxic edema on the uninjured side after traumatic brain injury 被引量:1
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作者 Hong Lu Xiaoyan Lei 《Neural Regeneration Research》 SCIE CAS CSCD 2014年第9期973-977,共5页
After traumatic brain injury, vasogenic and cytotoxic edema appear sequentially on the involved side. Neuroimaging investigations of edema on the injured side have employed apparent diffusion coefficient measurements ... After traumatic brain injury, vasogenic and cytotoxic edema appear sequentially on the involved side. Neuroimaging investigations of edema on the injured side have employed apparent diffusion coefficient measurements in diffusion tensor imaging. We investigated the changes occurring on the injured and uninjured sides using diffusion tensor imaging/apparent diffusion coefficient and histological samples in rats. We found that, on the injured side, that vasogenic edema appeared at 1 hour and intracellular edema appeared at 3 hours. Mixed edema was observed at 6 hours, worsening until 12–24 hours post-injury. Simultaneously, microglial cells proliferated at the trauma site. Apparent diffusion coefficient values increased at 1 hour, decreased at 6 hours, and increased at 12 hours. The uninjured side showed no significant pathological change at 1 hour after injury. Cytotoxic edema appeared at 3 hours, and vasogenic edema was visible at 6 hours. Cytotoxic edema persisted, but vasogenic edema tended to decrease after 12–24 hours. Despite this complex edema pattern on the uninjured side with associated pathologic changes, no significant change in apparent diffusion coefficient values was detected over the first 24 hours. Apparent diffusion coefficient values accurately detected the changes on the injured side, but did not detect the changes on the uninjured side, giving a false-negative result. 展开更多
关键词 nerve regeneration brain injuries blood-brain barrier magnetic resonance imaging apparent diffusion coefficient intracranial edema cytotoxic edema vasogenic edema PATHOLOGY NSFC grant neural regeneration
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Diffusion mechanisms in the Fe_3Si alloys 被引量:2
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作者 CHENYong-chong ZHANGYong-gang +1 位作者 WEIBing-chen CHENChang-qi 《原子与分子物理学报》 CAS CSCD 北大核心 2003年第2期143-148,共6页
In this paper, the possible reasons for the high thermal vacancy concentration and the low migration barriers for the Fe atom diffusion in the stoichiometric D0 3 structure Fe 3Si have been discussed. The high thermal... In this paper, the possible reasons for the high thermal vacancy concentration and the low migration barriers for the Fe atom diffusion in the stoichiometric D0 3 structure Fe 3Si have been discussed. The high thermal vacancy concentration was attributed to the compression of Fe-Fe atomic pairs and the tension of Fe-Si atomic pairs in Fe 75 Si 25 . The deformations (compression or tension) of the atompairs increase the interatomic potentials and thus decrease the enthalpies of vacancy formation. The low migration barriers for the Fe atom diffusion in Fe 75 Si 25 were related to the symmetric property of the triangular barriers. Additionally, it was considered that the Si atoms in Fe 3Si could probably migrate via nearest neighbour jumps without disturbing the long range order of atomic arrangements, provided that during the diffusion process the residence time on the antistructure sites is very short. 展开更多
关键词 Fe2Si合金 铁硅合金 自扩散 空穴 结构 迁移势垒
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Energetics and diffusion of point defects in Au/Ag metals:A molecular dynamics study
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作者 Zhi-Yong Liu Bin He +3 位作者 Xin Qu Li-Bo Niu Ru-Song Li Fei Wang 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第8期95-104,共10页
To reveal the potential aging mechanism for self-irradiation in Pu-Ga alloy,we choose Au-Ag alloy as its substitutional material in terms of its mass density and lattice structure.As a first step for understanding the... To reveal the potential aging mechanism for self-irradiation in Pu-Ga alloy,we choose Au-Ag alloy as its substitutional material in terms of its mass density and lattice structure.As a first step for understanding the microscopic behavior of point defects in Au-Ag alloy,we perform a molecular dynamics(MD)simulation on energetics and diffusion of point defects in Au and Ag metal.Our results indicate that the octahedral self-interstitial atom(SIA)is more stable than the tetrahedral SIA.The stability sequence of point defects for He atom in Au/Ag is:substitutional site>octahedral interstitial site>tetrahedral interstitial site.The He-V cluster(Hen Vm,V denotes vacancy)is the most stable at n=m.For the mono-vacancy diffusion,the MD calculation shows that the first nearest neighbour(1 NN)site is the most favorable site on the basis of the nudged elastic band(NEB)calculation,which is in agreement with previous experimental data.There are two peaks for the second nearest neighbour(2 NN)and the third nearest neighbour(3 NN)diffusion curve in octahedral interstitial site for He atom,indicating that the 2 NN and 3 NN diffusion for octahedral SIA would undergo an intermediate defect structure similar to the 1 NN site.The 3 NN diffusion for the tetrahedral SIA and He atom would undergo an intermediate site in analogy to its initial structure.For diffusion of point defects,the vacancy,SIA,He atom and He-V cluster may have an analogous effect on the diffusion velocity in Ag. 展开更多
关键词 interatomic potential radiation damage point DEFECT diffusion barrier
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Effect of Anti-Diffusion Oxide Layer on Enhanced Thermal Stability of Magnetic Tunnel Junctions
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作者 张宗芝 赵慧 +1 位作者 Cardoso S. Freitas P.P. 《Chinese Physics Letters》 SCIE CAS CSCD 2006年第4期932-935,共4页
Magnetic tunnel junctions (MTJs) with one proper oxidized FeOx layer placed between the Al oxide barrier and the top CoFe pinned layer show large tunnelling-magnetoresistance (TMR) signals as high as 39% after ann... Magnetic tunnel junctions (MTJs) with one proper oxidized FeOx layer placed between the Al oxide barrier and the top CoFe pinned layer show large tunnelling-magnetoresistance (TMR) signals as high as 39% after anneal at 380℃. The increased TMR signal may originate from the as-deposited Fe/FeOx (non-magnetic) layers changing to Fe+magnetic FeOy layer (some Fe3O4 and mostly other kind of magnetic Fe oxide) after high temperature anneal. The maximum TMR value (TMR ) and the corresponding temperature Ts where the TMRmax occurs upon annealing are closely associated with the oxidation time of the AlOx and FeOx layers, too long oxidation for the Fe layers is detrimental for the TMR value. In addition to the enhanced AlOx barrier quality upon anneal, the improved thermal stability is also attributed to the Mn diffusion retardation by the presence of the FeOx layer which acts as an antidiffusion layer. For MTJs without the interposed FeOx layer, the TMR signal reduction at 300℃ originates from the Mnlr/CoFe partially decoupling and CoFe/AlOx interface polarization loss due to the significant Mn diffusion. 展开更多
关键词 ROOM-TEMPERATURE MAGNETORESISTANCE INTERFACE barrierS diffusion
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