The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines (SVM) classif...The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines (SVM) classifier was proposed in this paper. Firstly, the fault model induced by cross-talk effect and the IDDT testing method were analyzed, and then a delay fault localization method based on SVM was presented. The fault features of the sampled signals were extracted by wavelet packet decomposition and served as input parameters of SVM classifier to classify the different fault types. The simulation results illustrate that the method presented is accurate and effective, reaches a high diagnosis rate above 95%.展开更多
The digitalization of arc welding power source mainly depends on the digitalization of arc welding inverter,so that main circuit and controlling system can give full play to advantages.Digital switching control makes ...The digitalization of arc welding power source mainly depends on the digitalization of arc welding inverter,so that main circuit and controlling system can give full play to advantages.Digital switching control makes main circuit digital and DSP and/or MCU makes controlling system,digital.So IGBT driving circuit,as a tie of main circuit and controlling system,should also be got digitalized.Thus,a digital driving circuit based on optocoupler device HCPL-316 J is provided.Some testing experiments were done.After driving testing,the driving circuit certificates that driving waveforms satisfy the requirements of arc welding power source and the driving circuit is reasonably and simply designed.And the driving circuit has high controlling precision and reliability.No-load-voltage testing and welding external characteristic testing prove that the driving circuit can be applied in arc welding power source.展开更多
In many areas, reliability of the digital circuits has become the key factor to restrict circuit development. Fault-tolerant design is the commonly used method to improve the reliability of digital circuits. The curre...In many areas, reliability of the digital circuits has become the key factor to restrict circuit development. Fault-tolerant design is the commonly used method to improve the reliability of digital circuits. The current fault-tolerant design methods are based on triple modular redundancy( TMR) or multiple modular redundancy( MMR). These redundancy designs rely on the experience of the designers,and the designed circuits have poor adaptabilities to a complex environment. However, evolutionary design of digital circuits does not rely on prior knowledge. During the evolution, some novel and optimal circuit topologies can be found, and the evolved circuits can feature strong adaptive capacities. Based on Cartesian genetic programming( CGP), a novel method for designing fault-tolerant digital circuits by evolution is proposed,key steps of the evolution are introduced,influences of function sets on evolution are investigated,and as a preliminary result,an evolved full adder with high fault-tolerance is shown.展开更多
With the development of integrated circuit, the content of digital circuit experiment course is constantly updated. In order to keep up with the development trend of the Times and make students’ professional knowledg...With the development of integrated circuit, the content of digital circuit experiment course is constantly updated. In order to keep up with the development trend of the Times and make students’ professional knowledge meet the needs of the industry, the school adopts the FPGA experimental platform to carry out teaching reform from the two aspects of platform and experiment, and carry out reasonable experimental planning to enrich the experimental content. In this paper, the traditional knowledge points of logic algebra, trigger, timer, counter, decoder and digital tube are organically combined, and the digital clock system is designed and realized. The practice shows that the combination of modern design method and traditional digital circuit teaching method can play a good teaching effect. In this way, students can also fully learn, understand and skillfully use the new technology in the experiment, and in the process of building a comprehensive understanding of digital circuits.展开更多
An important means for digital circuit analysis, design. maintenance and production is the IC chip test and analysis. With digital circuit application prevailing today, the automatic test and analysis of digital circu...An important means for digital circuit analysis, design. maintenance and production is the IC chip test and analysis. With digital circuit application prevailing today, the automatic test and analysis of digital circuits is going to play a more important role. It can save a great deal of time and cost for the maintenance of equipment and can also provide correst analytical data for designers.展开更多
Ordinary algebra is used to represent Boolean algebra on logic variables with states 0 and 1, so to achieve a unify approach to simulated both digital and analog circuit in PSPICE. Result on mixed A/D simulation shows...Ordinary algebra is used to represent Boolean algebra on logic variables with states 0 and 1, so to achieve a unify approach to simulated both digital and analog circuit in PSPICE. Result on mixed A/D simulation shows a save in memory but generally longer run time.展开更多
The paper reveals the relation between the linear AND-OR gate and the emitter function logic. With theoretic calculation and PSPICE simulation, the paper proves that the linear AND-OR gates can work at super-high-spee...The paper reveals the relation between the linear AND-OR gate and the emitter function logic. With theoretic calculation and PSPICE simulation, the paper proves that the linear AND-OR gates can work at super-high-speed and can be multi-cascaded. On the basis of analyzing the high-speed switch units which coordinate with linear AND-OR gates, two kinds of emitter coupled logic circuits are designed. The paper also discusses the design principles of super-high-speed digital circuits, and some examples of combinational and sequential circuits using linear AND-OR gate are given.展开更多
This article is dealing with a development of custom chip expander platform with the possibility of accurate temperature control and integration of additional silicon-based features. Such platform may serve as a usefu...This article is dealing with a development of custom chip expander platform with the possibility of accurate temperature control and integration of additional silicon-based features. Such platform may serve as a useful tool which facilitates the burdens connected with measurement and analysis tasks of experimental semiconductor structures. The devised solution provides the functionality of carrier substrate (Al2O3 compound) with CTE compatibility to the experimental silicon chip and is fully customizable with respect to a particular chip. It also allows achieving an easy fan-out of small-diameter chip terminals into a larger, more convenient area and placement of chip specimens conveniently into space-constrained chamber of the AFM microscopes, probe stations, etc. Real application of the developed chip expander platform is demonstrated in context of digital reconfigurable circuits based on polymorphic electronics. In this case the chip expander with attached polymorphic chip REPOMO is thermally stabilized at an ambient temperature level up to approximately 135。C and its sensitivity to this phenomenon is demonstrated.展开更多
This paper analyses the transient characteristics of high temperature CMOS inverters and gate circuits, and gives the computational formulas of their rise time, fall time and delay time. It may be concluded that the t...This paper analyses the transient characteristics of high temperature CMOS inverters and gate circuits, and gives the computational formulas of their rise time, fall time and delay time. It may be concluded that the transient characteristics of CMOS inverters and gate circuits deteriorate due to the reduction of carrier mobilities and threshold voltages of MOS transistors and the increase of leakage currents of MOS transistors drain terminal pn junctions. The calculation results can explain the experimental phenomenon.展开更多
A binary tree representation is designed in this paper for optimization of wave digital filter(WDF)implementation.To achieve this,an equivalent WDF model of the original circuit is converted into abinary tree repres...A binary tree representation is designed in this paper for optimization of wave digital filter(WDF)implementation.To achieve this,an equivalent WDF model of the original circuit is converted into abinary tree representation at first.This WDF binary tree can then be transformed to several topologies with the same implication,since the WDF adaptors have a symmetrical behavior on their ports.Because the WDF implementation is related to field programmable gate array(FPGA)resource usage and the cycle time of emulation,choosing aproper binary tree topology for WDF implementation can help balance the complexity and performance quality of an emulation system.Both WDF-FPGA emulation and HSpice simulation on the same circuit are tested.There is no significant difference between these two simulations.However,in terms of time consumption,the WDF-FPGA emulation has an advantage over the other.Our experiment also demonstrates that the optimized WDF-FPGA emulation has an acceptable accuracy and feasibility.展开更多
基金Supported by the National Natural Science Foun-dation of China (60374008 ,60501022)
文摘The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines (SVM) classifier was proposed in this paper. Firstly, the fault model induced by cross-talk effect and the IDDT testing method were analyzed, and then a delay fault localization method based on SVM was presented. The fault features of the sampled signals were extracted by wavelet packet decomposition and served as input parameters of SVM classifier to classify the different fault types. The simulation results illustrate that the method presented is accurate and effective, reaches a high diagnosis rate above 95%.
文摘The digitalization of arc welding power source mainly depends on the digitalization of arc welding inverter,so that main circuit and controlling system can give full play to advantages.Digital switching control makes main circuit digital and DSP and/or MCU makes controlling system,digital.So IGBT driving circuit,as a tie of main circuit and controlling system,should also be got digitalized.Thus,a digital driving circuit based on optocoupler device HCPL-316 J is provided.Some testing experiments were done.After driving testing,the driving circuit certificates that driving waveforms satisfy the requirements of arc welding power source and the driving circuit is reasonably and simply designed.And the driving circuit has high controlling precision and reliability.No-load-voltage testing and welding external characteristic testing prove that the driving circuit can be applied in arc welding power source.
基金National Natural Science Foundations of China(Nos.61271153,61372039)
文摘In many areas, reliability of the digital circuits has become the key factor to restrict circuit development. Fault-tolerant design is the commonly used method to improve the reliability of digital circuits. The current fault-tolerant design methods are based on triple modular redundancy( TMR) or multiple modular redundancy( MMR). These redundancy designs rely on the experience of the designers,and the designed circuits have poor adaptabilities to a complex environment. However, evolutionary design of digital circuits does not rely on prior knowledge. During the evolution, some novel and optimal circuit topologies can be found, and the evolved circuits can feature strong adaptive capacities. Based on Cartesian genetic programming( CGP), a novel method for designing fault-tolerant digital circuits by evolution is proposed,key steps of the evolution are introduced,influences of function sets on evolution are investigated,and as a preliminary result,an evolved full adder with high fault-tolerance is shown.
文摘With the development of integrated circuit, the content of digital circuit experiment course is constantly updated. In order to keep up with the development trend of the Times and make students’ professional knowledge meet the needs of the industry, the school adopts the FPGA experimental platform to carry out teaching reform from the two aspects of platform and experiment, and carry out reasonable experimental planning to enrich the experimental content. In this paper, the traditional knowledge points of logic algebra, trigger, timer, counter, decoder and digital tube are organically combined, and the digital clock system is designed and realized. The practice shows that the combination of modern design method and traditional digital circuit teaching method can play a good teaching effect. In this way, students can also fully learn, understand and skillfully use the new technology in the experiment, and in the process of building a comprehensive understanding of digital circuits.
文摘An important means for digital circuit analysis, design. maintenance and production is the IC chip test and analysis. With digital circuit application prevailing today, the automatic test and analysis of digital circuits is going to play a more important role. It can save a great deal of time and cost for the maintenance of equipment and can also provide correst analytical data for designers.
文摘Ordinary algebra is used to represent Boolean algebra on logic variables with states 0 and 1, so to achieve a unify approach to simulated both digital and analog circuit in PSPICE. Result on mixed A/D simulation shows a save in memory but generally longer run time.
基金Supported by the National Natural Science Foundation of China
文摘The paper reveals the relation between the linear AND-OR gate and the emitter function logic. With theoretic calculation and PSPICE simulation, the paper proves that the linear AND-OR gates can work at super-high-speed and can be multi-cascaded. On the basis of analyzing the high-speed switch units which coordinate with linear AND-OR gates, two kinds of emitter coupled logic circuits are designed. The paper also discusses the design principles of super-high-speed digital circuits, and some examples of combinational and sequential circuits using linear AND-OR gate are given.
文摘This article is dealing with a development of custom chip expander platform with the possibility of accurate temperature control and integration of additional silicon-based features. Such platform may serve as a useful tool which facilitates the burdens connected with measurement and analysis tasks of experimental semiconductor structures. The devised solution provides the functionality of carrier substrate (Al2O3 compound) with CTE compatibility to the experimental silicon chip and is fully customizable with respect to a particular chip. It also allows achieving an easy fan-out of small-diameter chip terminals into a larger, more convenient area and placement of chip specimens conveniently into space-constrained chamber of the AFM microscopes, probe stations, etc. Real application of the developed chip expander platform is demonstrated in context of digital reconfigurable circuits based on polymorphic electronics. In this case the chip expander with attached polymorphic chip REPOMO is thermally stabilized at an ambient temperature level up to approximately 135。C and its sensitivity to this phenomenon is demonstrated.
基金Supported by the National Native Science Foundation of China
文摘This paper analyses the transient characteristics of high temperature CMOS inverters and gate circuits, and gives the computational formulas of their rise time, fall time and delay time. It may be concluded that the transient characteristics of CMOS inverters and gate circuits deteriorate due to the reduction of carrier mobilities and threshold voltages of MOS transistors and the increase of leakage currents of MOS transistors drain terminal pn junctions. The calculation results can explain the experimental phenomenon.
基金Supported by the National Natural Science Foundation of China(61271113)
文摘A binary tree representation is designed in this paper for optimization of wave digital filter(WDF)implementation.To achieve this,an equivalent WDF model of the original circuit is converted into abinary tree representation at first.This WDF binary tree can then be transformed to several topologies with the same implication,since the WDF adaptors have a symmetrical behavior on their ports.Because the WDF implementation is related to field programmable gate array(FPGA)resource usage and the cycle time of emulation,choosing aproper binary tree topology for WDF implementation can help balance the complexity and performance quality of an emulation system.Both WDF-FPGA emulation and HSpice simulation on the same circuit are tested.There is no significant difference between these two simulations.However,in terms of time consumption,the WDF-FPGA emulation has an advantage over the other.Our experiment also demonstrates that the optimized WDF-FPGA emulation has an acceptable accuracy and feasibility.