This paper presents a high-speed column-parallel cyclic analog-to-digital converter（ADC） for a CMOS image sensor.A correlated double sampling（CDS） circuit is integrated in the ADC,which avoids a stand-alone CDS ci...This paper presents a high-speed column-parallel cyclic analog-to-digital converter（ADC） for a CMOS image sensor.A correlated double sampling（CDS） circuit is integrated in the ADC,which avoids a stand-alone CDS circuit block.An offset cancellation technique is also introduced,which reduces the column fixed-pattern noise（FPN） effectively.One single channel ADC with an area less than 0.02 mm^2 was implemented in a 0.13μm CMOS image sensor process.The resolution of the proposed ADC is 10-bit,and the conversion rate is 1.6 MS/s. The measured differential nonlinearity and integral nonlinearity are 0.89 LSB and 6.2 LSB together with CDS, respectively.The power consumption from 3.3 V supply is only 0.66 mW.An array of 48 10-bit column-parallel cyclic ADCs was integrated into an array of CMOS image sensor pixels.The measured results indicated that the ADC circuit is suitable for high-speed CMOS image sensors.展开更多
Working principles of silicon double P-N junction color sensor are introduced and a color measurement system to distinguish tooth color difference is designed in this paper.This system consists of silicon double P-N j...Working principles of silicon double P-N junction color sensor are introduced and a color measurement system to distinguish tooth color difference is designed in this paper.This system consists of silicon double P-N junction,a small optical fiber probe,signal process circuit and an MSP430FG439 single-chip system.Small in size,this system can measure different parts of the tooth in a fast and convenient way with high-accuracy.Thus,this system will be very promising in building prosthodontics and tooth fabrication.展开更多
基金supported by the National Natural Science Foundation of China(Nos.60976023,61234003)the Special Funds for Major State Basic Research Project of China(No.2011CB932902)
文摘This paper presents a high-speed column-parallel cyclic analog-to-digital converter（ADC） for a CMOS image sensor.A correlated double sampling（CDS） circuit is integrated in the ADC,which avoids a stand-alone CDS circuit block.An offset cancellation technique is also introduced,which reduces the column fixed-pattern noise（FPN） effectively.One single channel ADC with an area less than 0.02 mm^2 was implemented in a 0.13μm CMOS image sensor process.The resolution of the proposed ADC is 10-bit,and the conversion rate is 1.6 MS/s. The measured differential nonlinearity and integral nonlinearity are 0.89 LSB and 6.2 LSB together with CDS, respectively.The power consumption from 3.3 V supply is only 0.66 mW.An array of 48 10-bit column-parallel cyclic ADCs was integrated into an array of CMOS image sensor pixels.The measured results indicated that the ADC circuit is suitable for high-speed CMOS image sensors.
基金supported by the Innovation Fund for Small Technology-based Firms of China (No.06C26222200838).
文摘Working principles of silicon double P-N junction color sensor are introduced and a color measurement system to distinguish tooth color difference is designed in this paper.This system consists of silicon double P-N junction,a small optical fiber probe,signal process circuit and an MSP430FG439 single-chip system.Small in size,this system can measure different parts of the tooth in a fast and convenient way with high-accuracy.Thus,this system will be very promising in building prosthodontics and tooth fabrication.
