In order to improve the measurement precision and increase the reliability of the femtosecond laser transient thermoreflectance system, the relative optical path difference between pump and probe beams is prolonged, w...In order to improve the measurement precision and increase the reliability of the femtosecond laser transient thermoreflectance system, the relative optical path difference between pump and probe beams is prolonged, which can improve the fitting accuracy of the experimental data to the theoretical model. A modified experimental setup is devised with the pump path intercalated a moving stage identical to the one in the probe path, which extends the optical path difference of the probe beam relative to the pump beam from 4 to 8 ns. The measured results indicate that the uncertainty from the misalignment and divergence of both beams can be ignored when the last 4 ns experimental data are connected with those of the first 4 ns smoothly. The as-obtained thermal conductance of AI/Si and Cr/Si interfaces agrees well with the reported experimental values, which verifies the reliability of this modified version of this measurement.展开更多
基金The National Basic Research Program of China(973 Program)(No.2011CB707605)the National Natural Science Foundation of China(No.51205061,50925519,51106029)+1 种基金the Natural Science Foundation of Jiangsu Province(No.BK2012340)the Ph.D.Programs Foundation of Ministry of Education of China(No.20110092120006)
文摘In order to improve the measurement precision and increase the reliability of the femtosecond laser transient thermoreflectance system, the relative optical path difference between pump and probe beams is prolonged, which can improve the fitting accuracy of the experimental data to the theoretical model. A modified experimental setup is devised with the pump path intercalated a moving stage identical to the one in the probe path, which extends the optical path difference of the probe beam relative to the pump beam from 4 to 8 ns. The measured results indicate that the uncertainty from the misalignment and divergence of both beams can be ignored when the last 4 ns experimental data are connected with those of the first 4 ns smoothly. The as-obtained thermal conductance of AI/Si and Cr/Si interfaces agrees well with the reported experimental values, which verifies the reliability of this modified version of this measurement.
