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Improvements to the extraction of an AlGaN/GaN HEMT small-signal model
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作者 蒲颜 庞磊 +3 位作者 王亮 陈晓娟 李诚瞻 刘新宇 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第12期25-29,共5页
The accurate extraction of AlGaN/GaN HEMT small-signal models, which is an important step in largesignal modeling, can exactly reflect the microwave performance of the physical structure of the device. A new method of... The accurate extraction of AlGaN/GaN HEMT small-signal models, which is an important step in largesignal modeling, can exactly reflect the microwave performance of the physical structure of the device. A new method of extracting the parasitic elements is presented, and an open dummy structure is introduced to obtain the parasitic capacitances. With a Schottky resistor in the gate, a new method is developed to extract Rg. In order to characterize the changes of the depletion region under various drain voltages, the drain delay factor is involved in the output conductance of the device. Compared to the traditional method, the fitting of S 11 and S 22 is improved, and fT and fmax can be better predicted. The validity of the proposed method is verified with excellent correlation between the measured and simulated S-parameters in the range of 0.1 to 26.1 GHz. 展开更多
关键词 AlGaN/GaN HEMT small-signal model Schottky resistor drain delay
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