By using AP-FIM the varity of the ordered degree of Ni_3Al with L1_2 structure with B content was studied. The possibility of boron improving ductility was also discussed from bonding between Ni and Al atoms, and anti...By using AP-FIM the varity of the ordered degree of Ni_3Al with L1_2 structure with B content was studied. The possibility of boron improving ductility was also discussed from bonding between Ni and Al atoms, and antisite defects in Ni_3Al. The extent of ordering is reduced with an increase in boron content and the autisite defects are most obvious for 0.52at.K B-doped sample that has the best ductility. Some results were verified by X-ray diffraction non. The addition of boron not only influences electron environment at grain boundary but also in the interior of Ni_3Al gm ins, the latter is favorable to improve the ductility of Ni_3Al grains.展开更多
Several concepts of the grain refinement mechanism of B on hypoeutectic Al-Si alloys have been adopted: the refining effect of B on the a-AI and eutectic Si with the different additions of Al-B master alloys made at ...Several concepts of the grain refinement mechanism of B on hypoeutectic Al-Si alloys have been adopted: the refining effect of B on the a-AI and eutectic Si with the different additions of Al-B master alloys made at 850℃ was investigated; and the Al-B master alloys formed under different temperature conditions have been studied to explore the morphologies of AIB2 particles; slowly cooled sample with addition of Al-B was made to explore the refinement mechanism. AI-B master alloy can refine not only a-AI, but eutectic Si. Theoretical analysis indicates that, although AIB2 does not take part directly in the nucleation process in pure Al in the presence of Si, it provides a substrate for precipitation of a small content of Si from which a-At will grow without any undercooling. When the temperature decreases to eutectic line, AIB2 subsequently nucleates eutectic Si; AIB2 particles appear in two different morphologies, namely, hexagonal platelet and tetradehedron morphology which depend on the processing temperature conditions.展开更多
Hydrogenated silicon carbide films (SiC:H) were deposited using the electron cyclotron resonance chemical vapour deposition (ECR-CVD) technique from a mixture of methane, silane and hydrogen, and using diborane and ph...Hydrogenated silicon carbide films (SiC:H) were deposited using the electron cyclotron resonance chemical vapour deposition (ECR-CVD) technique from a mixture of methane, silane and hydrogen, and using diborane and phosphine as doping gases. The effects of changes in the microwave power on the deposition rate and optical bandgap were investigated, and variations in the photoand dark-conductivities and activation energy were studied in conjunction with film analysis using the Raman scattering technique. In the case of boron-doped samples, the conductivity increased rapidly to a maximum, followed by rapid reduction at high microwave power. The ratio of the photo- to dark-conductivity (σph/σd) peaked at microwave power of ~600 W. Under conditions of high microwave power, Raman scattering analysis showed evidence of the formation and increase in the silicon microcrystalline and diamond-like phases in the films, the former of which could account for the rapid increase and the latter the subsequent decrease in the conductivity.In the case of phosphorusdoped SiC:H samples, it was found that increase in the microwave power has the effect of enhancing the formation of the silicon microcrystalline phase in the films which occurred in correspondence to a rapid increase in the conductivity and reduction in the activation energy The conductivity increase stabilised in samples deposited at microwave power exceeding 500 W probably as a result of dopant saturation. Results from Raman scattering measurements also showed that phosphorus doping had the effect of enhancing the formation of the silicon microcrystals in the film whereas the presence of boron had the effect of preserving the amorphous structure.展开更多
The segregation and diffusion of boron during heat treatments were studied. The influence of boron contents, aging time and applied stress on FeMo2B2 formation was also studied. Finally, the effects of boron contents ...The segregation and diffusion of boron during heat treatments were studied. The influence of boron contents, aging time and applied stress on FeMo2B2 formation was also studied. Finally, the effects of boron contents and FeMo2B2 formation on the high temperature strength were studied. Boron atoms were segregated to prior austenite grain boundary during normalizing treatment. And these boron atoms were slowly diffused into the grain interior during tempering and aging at 700 ℃. The FeMo2B2 phase was only formed after 1,000 h aging at 700 ℃ in alloy containing 196 ppm boron. The formation of FeMo2B2 phase is accelerated by the applied stress. It was expected that the formation of FeMo2B2 is closely related to the redistribution of boron atoms. The tensile strengths at 700 ℃ are increased with the increase of boron contents. However, the formation of FeMo2B2 phase results in lower tensile strength.展开更多
基金This project was supported by the National Nature Science Foundation of China!(Grant No.59831020 and 59895156)
文摘By using AP-FIM the varity of the ordered degree of Ni_3Al with L1_2 structure with B content was studied. The possibility of boron improving ductility was also discussed from bonding between Ni and Al atoms, and antisite defects in Ni_3Al. The extent of ordering is reduced with an increase in boron content and the autisite defects are most obvious for 0.52at.K B-doped sample that has the best ductility. Some results were verified by X-ray diffraction non. The addition of boron not only influences electron environment at grain boundary but also in the interior of Ni_3Al gm ins, the latter is favorable to improve the ductility of Ni_3Al grains.
基金Shandong Natural Foundation !(Grant No:Z99F01)the Natiotal Natals Science Foundation of China !(Grant NO.59671046).
文摘Several concepts of the grain refinement mechanism of B on hypoeutectic Al-Si alloys have been adopted: the refining effect of B on the a-AI and eutectic Si with the different additions of Al-B master alloys made at 850℃ was investigated; and the Al-B master alloys formed under different temperature conditions have been studied to explore the morphologies of AIB2 particles; slowly cooled sample with addition of Al-B was made to explore the refinement mechanism. AI-B master alloy can refine not only a-AI, but eutectic Si. Theoretical analysis indicates that, although AIB2 does not take part directly in the nucleation process in pure Al in the presence of Si, it provides a substrate for precipitation of a small content of Si from which a-At will grow without any undercooling. When the temperature decreases to eutectic line, AIB2 subsequently nucleates eutectic Si; AIB2 particles appear in two different morphologies, namely, hexagonal platelet and tetradehedron morphology which depend on the processing temperature conditions.
文摘Hydrogenated silicon carbide films (SiC:H) were deposited using the electron cyclotron resonance chemical vapour deposition (ECR-CVD) technique from a mixture of methane, silane and hydrogen, and using diborane and phosphine as doping gases. The effects of changes in the microwave power on the deposition rate and optical bandgap were investigated, and variations in the photoand dark-conductivities and activation energy were studied in conjunction with film analysis using the Raman scattering technique. In the case of boron-doped samples, the conductivity increased rapidly to a maximum, followed by rapid reduction at high microwave power. The ratio of the photo- to dark-conductivity (σph/σd) peaked at microwave power of ~600 W. Under conditions of high microwave power, Raman scattering analysis showed evidence of the formation and increase in the silicon microcrystalline and diamond-like phases in the films, the former of which could account for the rapid increase and the latter the subsequent decrease in the conductivity.In the case of phosphorusdoped SiC:H samples, it was found that increase in the microwave power has the effect of enhancing the formation of the silicon microcrystalline phase in the films which occurred in correspondence to a rapid increase in the conductivity and reduction in the activation energy The conductivity increase stabilised in samples deposited at microwave power exceeding 500 W probably as a result of dopant saturation. Results from Raman scattering measurements also showed that phosphorus doping had the effect of enhancing the formation of the silicon microcrystals in the film whereas the presence of boron had the effect of preserving the amorphous structure.
基金This work was financially supported by the Ministry of Commerce,Industry and Energy of Korea.
文摘The segregation and diffusion of boron during heat treatments were studied. The influence of boron contents, aging time and applied stress on FeMo2B2 formation was also studied. Finally, the effects of boron contents and FeMo2B2 formation on the high temperature strength were studied. Boron atoms were segregated to prior austenite grain boundary during normalizing treatment. And these boron atoms were slowly diffused into the grain interior during tempering and aging at 700 ℃. The FeMo2B2 phase was only formed after 1,000 h aging at 700 ℃ in alloy containing 196 ppm boron. The formation of FeMo2B2 phase is accelerated by the applied stress. It was expected that the formation of FeMo2B2 is closely related to the redistribution of boron atoms. The tensile strengths at 700 ℃ are increased with the increase of boron contents. However, the formation of FeMo2B2 phase results in lower tensile strength.