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Effect of ionizing radiation on dual 8-bit analog-to-digital converters (AD9058) with various dose rates and bias conditions 被引量:1
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作者 李兴冀 刘超铭 +2 位作者 孙中亮 肖立伊 何世禹 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第9期629-633,共5页
The radiation effects on several properties (reference voltage, digital output logic voltage, and supply current) of dual 8-bit analog-to-digital (A/D) converters (AD9058) under various biased conditions are inv... The radiation effects on several properties (reference voltage, digital output logic voltage, and supply current) of dual 8-bit analog-to-digital (A/D) converters (AD9058) under various biased conditions are investigated in this paper. Gamma ray and 10-MeV proton irradiation are selected for a detailed evaluation and comparison. Based on the measurement results induced by the gamma ray with various dose rates, the devices exhibit enhanced low dose rate sensitivity (ELDRS) under zero and working bias conditions. Meanwhile, it is obvious that the ELDRS is more severe under the working bias condition than under the zero bias condition. The degradation of AD9058 does not display obvious ELDRS during 10-MeV proton irradiation with the selected flux. 展开更多
关键词 analog-to-digital converters enhanced low dose rate sensitivities (ELDRS) gamma ray and protonirradiation lower/high-dose rate
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Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor 被引量:1
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作者 Xiao-Long Li Wu Lu +7 位作者 Xin Wang Xin Yu Qi Guo Jing Sun Mo-Han Liu Shuai Yao Xin-Yu Wei Cheng-Fa He 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第3期342-350,共9页
The mechanisms occurring when the switched temperature technique is applied,as an accelerated enhanced low dose rate sensitivity(ELDRS)test technique,are investigated in terms of a specially designed gate-controlled l... The mechanisms occurring when the switched temperature technique is applied,as an accelerated enhanced low dose rate sensitivity(ELDRS)test technique,are investigated in terms of a specially designed gate-controlled lateral PNP transistor(GLPNP)that used to extract the interface traps(Nit)and oxide trapped charges(Not).Electrical characteristics in GLPNP transistors induced by ^(60)Co gamma irradiation are measured in situ as a function of total dose,showing that generation of Nit in the oxide is the primary cause of base current variations for the GLPNP.Based on the analysis of the variations of Nit and Not,with switching the temperature,the properties of accelerated protons release and suppressed protons loss play critical roles in determining the increased Nit formation leading to the base current degradation with dose accumulation.Simultaneously the hydrogen cracking mechanisms responsible for additional protons release are related to the neutralization of Not extending enhanced Nit buildup.In this study the switched temperature irradiation has been employed to conservatively estimate the ELDRS of GLPNP,which provides us with a new insight into the test technique for ELDRS. 展开更多
关键词 ionizing radiation damage enhanced low dose rate sensitivity(ELDRS) switched temperature irradiation gate-controlled lateral PNP transistor(GLPNP)
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Studies on Rate Enhancement of Polymerization in NMRP
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作者 HUANG Jian-ying XU Miao-qing +5 位作者 YAN Ming-fa CHEN Yi-hong CHU Jia-yan ZHUANG Jia-ming DAI Li-zong ZOU You-si 《Chemical Research in Chinese Universities》 SCIE CAS CSCD 2005年第6期734-736,共3页
In NMRP, the polymerization of MMA, the polymerization of St and the copolymerization of MMA with St were distinctly accelerated by the addition of a small amount of MN. The polymerization proceeds in a living fashion... In NMRP, the polymerization of MMA, the polymerization of St and the copolymerization of MMA with St were distinctly accelerated by the addition of a small amount of MN. The polymerization proceeds in a living fashion as indicated by the increase in molecular weight with the increase of time and conversion and a relatively low polydispersity. It has been found that the addition of MN results in a nearly one hundred times higher rate of the polymerization of MMA, a nearly twenty times higher rate of the polymerization of St and a nearly fifteen times higher rate of the copolymerization of St and MMA. 展开更多
关键词 rate enhancement Living free radical polymerization TEMPO MN
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Turbo-Coded Modulation of EVRC Speech Encoder with Unequal Error Protection for Fading Channels
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作者 阿哈麦德 潘志文 +1 位作者 高西奇 尤肖虎 《Journal of Shanghai Jiaotong university(Science)》 EI 2003年第2期150-156,共7页
The Enhanced Variable Rate Codec (EVRC) is a standard for the Speech Service Option 3 for Wideband Spread Spectrum Digital System, which has been employed in both IS-95 cellular systems and ANSI J-STC-008 PCS (Persona... The Enhanced Variable Rate Codec (EVRC) is a standard for the Speech Service Option 3 for Wideband Spread Spectrum Digital System, which has been employed in both IS-95 cellular systems and ANSI J-STC-008 PCS (Personal Communications Systems). This paper investigated the combination of turbo codes with Unequal Error Protection (UEP) and 16-QAM modulation for EVRC codec of Rate 1 to get power and bandwidth efficient coding scheme. The results show that the UEP system outperforms the Equal Error Protection (EEP) one by 1.45 dB at BER of 10 -5. 展开更多
关键词 enhanced variable rate codec (EVRC) turbo codes unequal error protection (UEP) quadrature amplitude modulation (QAM)
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Using Longitudinal Fins to Improve the Melting Performance of Stearic Acid in Thermal Energy Storage Devices
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作者 YAN Suying LIU Yiran +4 位作者 AO Ci ZHAO Xiaoyan ZHANG Na ZHANG Ruiying AHMADI Mohammad Hossein 《Journal of Thermal Science》 SCIE EI CAS CSCD 2024年第5期1672-1687,共16页
The heat transfer efficiency of a thermal energy storage unit(TESU)can be improved by the addition of novel longitudinal fins.A series of TESUs are analyzed using the finite volume method(FVM)to determine the effect o... The heat transfer efficiency of a thermal energy storage unit(TESU)can be improved by the addition of novel longitudinal fins.A series of TESUs are analyzed using the finite volume method(FVM)to determine the effect of fin angle on the heat transfer performance.As the fin angle increases,the TES rate first increases,then decreases,reaching a maximum rate at 60°,where the melting time is less by 30.9%,28.58%,21.99%,9.02%,and 18.1%than at 0°,15°,30°,45°,and 80°,respectively.In addition,it is found that the melting time of the phase change material is significantly greater at the bottom of the TESU.The time percentage of this stage decreases as the fin angle increases through these percentages by 7%,14%,23%,33%,and 20%,respectively.Further,the response surface methodology(RSM)is applied to optimize the longitudinal fin by minimizing the total melting time.The analysis concludes that a fin angle of 58.68°reduces the complete melting time of the stearic acid by 44%below the time at 0°.These findings fill a gap in knowledge of the effect on melting performance of the design angle of longitudinal fins and provide a reference for the design of horizontally placed longitudinal finned thermal energy storage units. 展开更多
关键词 thermal energy storage melting rate enhancement longitudinal fins fin angle phase change materials
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