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Predicting stability of integrated circuit test equipment using upper side boundary values of normal distribution
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作者 Zhan Wenfa Hu Xinyi +3 位作者 Zheng Jiangyun Yu Chuxian Cai Xueyuan Zhang Lihua 《The Journal of China Universities of Posts and Telecommunications》 EI CSCD 2024年第2期85-93,共9页
In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability us... In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability using the upper side boundary value of normal distribution.Initially,the K-means clustering algorithm classifies and analyzes sample data.The accuracy of this boundary value is compared under two common confidence levels to select the optimal threshold.A range is then defined to categorize unqualified test data.Through experimental verification,the method achieves the purpose of measuring the stability of qualitative IC equipment through a deterministic threshold value and judging the stability of the equipment by comparing the number of unqualified data with the threshold value,which realizes the goal of long-term operation monitoring and stability analysis of IC test equipment. 展开更多
关键词 K-means clustering algorithm the upper side boundary of normal distribution THRESHOLD integrated circuit(IC)test equipment stability analysis
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