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Reliable and broad-range layer identification of Au-assisted exfoliated large area MoS_(2)and WS_(2)using reflection spectroscopic fingerprints
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作者 Bo Zou Yu Zhou +9 位作者 Yan Zhou Yanyan Wu Yang He Xiaonan Wang Jinfeng Yang Lianghui Zhang Yuxiang Chen Shi Zhou Huaixin Guo Huarui Sun 《Nano Research》 SCIE EI CSCD 2022年第9期8470-8478,共9页
The emerging Au-assisted exfoliation technique enables the production of a wealth of large-area and high-quality ultrathin two dimensional(2D)crystals.Fast,damage-free,and reliable determination of the layer number of... The emerging Au-assisted exfoliation technique enables the production of a wealth of large-area and high-quality ultrathin two dimensional(2D)crystals.Fast,damage-free,and reliable determination of the layer number of such 2D films can greatly promote layer-dependent physical studies and device applications.Here,an optical method has been developed for simple,high throughput,and accurate determination of the layer number for Au-assisted exfoliated MoS_(2)and WS_(2)films in a broad thickness range.The method is based on quantitative analysis of layer-dependent white light reflection spectra(WLRS),revealing that the intensity of exciton-induced reflection peaks can be used as a clear indicator for identifying the layer number.The simple yet robust method will facilitate fundamental studies on layer-dependent optical,electrical,and thermal properties and device applications of 2D materials.The technique can also be readily combined with photoluminescence(PL)and Raman spectroscopies to study other layer-dependent physical properties of 2D materials. 展开更多
关键词 Au-assisted exfoliation MoS_(2)and WS_(2) layer identification white light reflection spectra excitonic peaks
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