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A Fault-Tolerant FPGA Architecture
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作者 Parag Kumar Lala Mohammed Tanveer Anwar James Patrick Parkerson 《Computer Technology and Application》 2011年第4期311-318,共8页
SRAM (Static RAM)-based FPGAs (Field Programmable Gate Arrays (FPGAs) have gained wide acceptance due to their on-line reconfigurable features. The growing demand for FPGAs has motivated semiconductor chip manufa... SRAM (Static RAM)-based FPGAs (Field Programmable Gate Arrays (FPGAs) have gained wide acceptance due to their on-line reconfigurable features. The growing demand for FPGAs has motivated semiconductor chip manufacturers to build more densely packed FPGAs with higher logic capacity. The downside of high density devices is that the probability of errors in such devices tends to increase. This paper proposes an FPGA architecture that is composed of an array of cells with built in error correction capability. Collectively a group of such cells can implement any logic function that is either registered or combinational. A cell is composed of three units: a logic block, a fault-tolerant address generator and a director unit. The logic block uses a look-up table to implement logic functions. The fault-tolerant address generator corrects any single bit error in the incoming data to the functional cell. The director block can transmit output data from the logic block to another cell located at its South, North, East or West, or to cells in all four directions. Thus a functional cell can also be used to route signals to other functional cells, thus avoiding any intricate network of interconnects, switching boxes, or routers commonly found in commercially available FPGAs. 展开更多
关键词 Soft error fault tolerant address generator configuration register director unit similarity circuit.
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