Influences of finite gain bandwidth on pulse propagation in parabolic fiber amplifiers with distributed gain profiles

The evolutions of the pulses propagating in decreasing and increasing gain distributed fiber amplifiers with finite gain bandwidths are investigated by simulations with the nonlinear SchrSdinger equation. The results show that the parabolic pulse propagations in both the decreasing and the increasing gain amplifiers are restricted by the finite gain bandwidth. For a given input pulse, by choosing a small initial gain coefficient and gain variation rate, the whole gain for the pulse amplification limited by the gain bandwidth may be higher, which is helpful for the enhancement of the output linearly chirped pulse energy. Compared to the decreasing gain distributed fiber amplifier, the increasing gain distributed amplifier may be more conducive to suppress the pulse spectral broadening and increase the critical amplifier length for achieving a larger output linearly chirped pulse energy.

New Curvature-Compensated CMOS Bandgap Voltage Reference

A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp bipolar transistor. The proposed circuit, designed in a standard 0.18 μm CMOS process, achieves a good temperature coefficient of 2.44 ppm/℃ with temperature range from --40℃ to 85 ℃, and about 4 mV supply voltage variation in the range from 1.4 V to 2.4 V. With a 1.8 V supply voltage, the power supply rejection ratio is -56dB at 10MHz.

A 12-bit 100 MS/s pipelined ADC with digital background calibration

This paper presents a 12-bit 100 MS/s CMOS pipelined analog-to-digital converter （ADC） with digital background calibration. A large magnitude calibration signal is injected into the multiplying digital-to-analog converter （MDAC） while the architecture of the MDAC remains unchanged. When sampled at 100 MS/s, it takes only 2.8 s to calibrate the 12-bit prototype ADC and achieves a peak spurious-free dynamic range of 85 dB and a peak signal-to-noise plus distortion ratio of 66 dB with 2 MHz input. Integral nonlinearity is improved from 1.9 to 0.6 least significant bits after calibration. The chip is fabricated in a 0.18μm CMOS process, occupies an active area of 2.3 × 1.6 mm^2, and consumes 205 mW at 1.8 V.

A robust and simple two-mode digital calibration technique for pipelined ADC

This paper presents a two-mode digital calibration technique for pipelined analog-to-digital converters （ADC）.The proposed calibration eliminates the errors of residual difference voltage induced by capacitor mismatch of pseudorandom（PN） sequence injection capacitors at the ADC initialization,while applies digital background calibration to continuously compensate the interstage gain errors in ADC normal operation.The presented technique not only reduces the complexity of analog circuit by eliminating the implementation of PN sequence with accurate amplitude in analog domain,but also improves the performance of digital background calibration by minimizing the sensitivity of calibration accuracy to sub-ADC errors.The use of opamps with low DC gains in normal operation makes the proposed design more compatible with future nanometer CMOS technology.The prototype of a 12-bit 40-MS/s pipelined ADC with the two-mode digital calibration is implemented in 0.18-μm CMOS process.Adopting a simple telescopic opamp with a DC gain of 58-dB in the first stage,the measured SFDR and SNDR within the first Nyquist zone reach 80-dB and 66-dB,respectively.With the calibration,the maximum integral nonlinearity （INL） of the ADC reduces from 4.75-LSB to 0.65-LSB,while the ADC core consumes 82-mW at 3.3-V power supply.