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State-of-the-art Technologies and Kinematical Analysis for One-Stop Finishing of φ300 mm Si Wafer
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作者 Hiroshi EDA Jun SHIMIZU 《厦门大学学报(自然科学版)》 CAS CSCD 北大核心 2002年第S1期300-301,共2页
This research has successfully developed an advance d manufacturing system for 300mm silicon wafer,using fixed abrasive instead o f conventional free slurry,to provide a totally integrated solution for achievi ng the ... This research has successfully developed an advance d manufacturing system for 300mm silicon wafer,using fixed abrasive instead o f conventional free slurry,to provide a totally integrated solution for achievi ng the surface roughness Ra<1 nm(Ry<5~6 nm) and the global flatness<O.2μm /300 mm.In addition to high throughput rate,this system significantly reduc es the total energy consumption by 70%,compared with the current process used for 200mm Si wafer.This paper describes the principle of material removal,st ate-of-the-art technologies and kinematical analysis for one-stop finishing o f 300mm Si wafer by fixed abrasive process. 展开更多
关键词 Si wafer fixed abrasive process POSITIONING alignm ent ductile grinding polishing-like finishing
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