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RELIABILITY OF TEST LANDS TARGETING IN BED-OF-NAILS STYLE TEST FIXTURE
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作者 HAN Lei VOLOSHIN Arkady 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2006年第1期151-155,共5页
A systematic, accurate and robust evaluating method for fine pitch printed circuit board (PCB) positioning assessment in testing fixture is developed. Targeting reliability of bed-of-nails tester is successfully eva... A systematic, accurate and robust evaluating method for fine pitch printed circuit board (PCB) positioning assessment in testing fixture is developed. Targeting reliability of bed-of-nails tester is successfully evaluated by the 2D pattern transform. Probe offset vector with its Weibull and Gaussian distribution estimates are obtained for further investigation about the causes of misalignment on the basis of a batch tests for same kind of PCBs. 展开更多
关键词 Printed circuit board (PCB) Deformation Test land Bed-of-nails testing fixture Weibull distribution
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