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Oxide-based thin film transistors for flexible electronics 被引量:3
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作者 Yongli He Xiangyu Wang +2 位作者 Ya Gao Yahui Hou Qing Wan 《Journal of Semiconductors》 EI CAS CSCD 2018年第1期57-72,共16页
The continuous progress in thin film materials and devices has greatly promoted the development in the field of flexible electronics. As one of the most common thin film devices, thin film transistors(TFTs) are sign... The continuous progress in thin film materials and devices has greatly promoted the development in the field of flexible electronics. As one of the most common thin film devices, thin film transistors(TFTs) are significant building blocks for flexible platforms. Flexible oxide-based TFTs are well compatible with flexible electronic systems due to low process temperature, high carrier mobility, and good uniformity. The present article is a review of the recent progress and major trends in the field of flexible oxide-based thin film transistors. First, an introduction of flexible electronics and flexible oxide-based thin film transistors is given. Next, we introduce oxide semiconductor materials and various flexible oxide-based TFTs classified by substrate materials including polymer plastics, paper sheets, metal foils, and flexible thin glass. Afterwards, applications of flexible oxide-based TFTs including bendable sensors, memories, circuits, and displays are presented. Finally, we give conclusions and a prospect for possible development trends. 展开更多
关键词 thin film transistors flexible electronics oxide semiconductor
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Review of recent progresses on flexible oxide semiconductor thin film transistors based on atomic layer deposition processes 被引量:4
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作者 Jiazhen Sheng Ki-Lim Han +2 位作者 TaeHyun Hong Wan-Ho Choi Jin-Seong Park 《Journal of Semiconductors》 EI CAS CSCD 2018年第1期105-116,共12页
The current article is a review of recent progress and major trends in the field of flexible oxide thin film transistors(TFTs), fabricating with atomic layer deposition(ALD) processes. The ALD process offers accur... The current article is a review of recent progress and major trends in the field of flexible oxide thin film transistors(TFTs), fabricating with atomic layer deposition(ALD) processes. The ALD process offers accurate controlling of film thickness and composition as well as ability of achieving excellent uniformity over large areas at relatively low temperatures. First, an introduction is provided on what is the definition of ALD, the difference among other vacuum deposition techniques, and the brief key factors of ALD on flexible devices. Second, considering functional layers in flexible oxide TFT, the ALD process on polymer substrates may improve device performances such as mobility and stability, adopting as buffer layers over the polymer substrate, gate insulators, and active layers. Third, this review consists of the evaluation methods of flexible oxide TFTs under various mechanical stress conditions. The bending radius and repetition cycles are mostly considering for conventional flexible devices. It summarizes how the device has been degraded/changed under various stress types(directions). The last part of this review suggests a potential of each ALD film, including the releasing stress, the optimization of TFT structure, and the enhancement of device performance. Thus, the functional ALD layers in flexible oxide TFTs offer great possibilities regarding anti-mechanical stress films, along with flexible display and information storage application fields. 展开更多
关键词 atomic layer deposition(ALD) oxide semiconductor thin film transistor flexible device mechanical stress
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