Aiming at the problem of diagnosing soft faults in analog integrated circuits, an approach based on fractional correlation is proposed. First, the Volterra series of the circuit under test （CUT） decomposed by the fr...Aiming at the problem of diagnosing soft faults in analog integrated circuits, an approach based on fractional correlation is proposed. First, the Volterra series of the circuit under test （CUT） decomposed by the fractional wavelet packet are used to calculate the fractional correlation functions. Then, the calculated fractional correlation functions are used to form the fault signatures of the CUT. By comparing the fault signatures, the different soft faulty conditions of the CUT are identified and the faults are located. Simulations of benchmark circuits illustrate the proposed method and validate its effectiveness in diagnosing soft faults in analog integrated circuits.展开更多
基金Project supported by the Program for New Century Excellent Talents in University,China(No.NCET-05-0804)the Chinese National Programs for High Technology Research and Development(No.2006AA06Z222)
文摘Aiming at the problem of diagnosing soft faults in analog integrated circuits, an approach based on fractional correlation is proposed. First, the Volterra series of the circuit under test （CUT） decomposed by the fractional wavelet packet are used to calculate the fractional correlation functions. Then, the calculated fractional correlation functions are used to form the fault signatures of the CUT. By comparing the fault signatures, the different soft faulty conditions of the CUT are identified and the faults are located. Simulations of benchmark circuits illustrate the proposed method and validate its effectiveness in diagnosing soft faults in analog integrated circuits.
