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Characteristic modification by inserted metal layer and interface graphene layer in ZnO-based resistive switching structures
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作者 刘浩男 索晓霞 +6 位作者 张林奥 张端 吴汉春 赵宏康 江兆潭 李英兰 王志 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第2期522-526,共5页
ZnO-based resistive switching device Ag/ZnO/TiN, and its modified structure Ag/ZnO/Zn/ZnO/TiN and Ag/graphene/ZnO/TiN, were prepared. The effects of inserted Zn layers in ZnO matrix and an interface graphene layer on ... ZnO-based resistive switching device Ag/ZnO/TiN, and its modified structure Ag/ZnO/Zn/ZnO/TiN and Ag/graphene/ZnO/TiN, were prepared. The effects of inserted Zn layers in ZnO matrix and an interface graphene layer on resistive switching characteristics were studied. It is found that metal ions, oxygen vacancies, and interface are involved in the RS process. A thin inserted Zn layer can increase the resistance of HRS and enhance the resistance ratio. A graphene interface layer between ZnO layer and top electrode can block the carrier transport and enhance the resistance ratio to several times. The results suggest feasible routes to tailor the resistive switching performance of ZnO-based structure. 展开更多
关键词 resistive switching ZnO graphene multilayer thin films
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