期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Growth Defects in Cubic KTa_(1-x)Nb_xO_3 Crystal 被引量:1
1
作者 王旭平 王继扬 +2 位作者 吴剑 于永贵 张怀金 《Chinese Journal of Structural Chemistry》 SCIE CAS CSCD 北大核心 2008年第3期261-266,共6页
Potassium tantalate niobate (KTa1-xNbxO3, KTN) crystals with different dimensions and quality situations were grown by Czochralski method. Crystal growth process and morphology properties of KTN are presented in thi... Potassium tantalate niobate (KTa1-xNbxO3, KTN) crystals with different dimensions and quality situations were grown by Czochralski method. Crystal growth process and morphology properties of KTN are presented in this paper. It was found that some defects, such as bubble, inclusion, crack, dislocation etc., can all appear if the crystal is grown in an improper condition. The character and formation mechanism of such defects in macro growth are discussed. We consider that the CO2, which was not released absolutely during the sintering process and dissolved in the melt, led to bubbles. The composition of the inclusion caused by high pulling and rotation rates is KTN polycrystalline. The crack and dislocation in KTN crystal mainly come from improper temperature field. Etching and high-resolution X-ray diffraction (HRXRD) experiment results indicate that the central area is the defects concentrated. 展开更多
关键词 potassium tantalate niobate (KTa1-xNbxO3 KTN) crystal growth czochralskimethod HRXRD growth defect etching
下载PDF
X-ray Multiple Diffraction Topographic Imaging Technique For Growth History Study of Habit Modifying Impurity Doped Crystals 被引量:1
2
作者 LAI X. MA C. +1 位作者 K. J. Robert M. C. Miller 《Chemical Research in Chinese Universities》 SCIE CAS CSCD 2004年第4期411-416,共6页
A novel crystal characterization instrument has been built up in which a combination of X-ray multiple diffraction and X-ray topography is applied to enabling the cross-correlation between micro-crystallographic symme... A novel crystal characterization instrument has been built up in which a combination of X-ray multiple diffraction and X-ray topography is applied to enabling the cross-correlation between micro-crystallographic symmetry and its spatial dependence in relation to lattice defects. This facility is used to examine, in a self-consistent manner, growth sector-dependant changes to both the crystallographic structure and the lattice defects associated with the action of habit-modifying additives in a number of representative crystal growth systems. In addition, the new instrument can be used to probe micro-crystallographic aspects(such as distortion to crystal symmetry) and relate these in a spatially resolved manner to the crystal defect structure in crystals doped with known habit modifiers. 展开更多
关键词 X-ray diffraction X-ray multiple diffraction X-ray topography Habit modification Crystal growth growth defects
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部