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A contrivance of 277 nm DUV LD with B0.313Ga0.687N/B0.40Ga0.60N QWs and AlxGa1–xN heterojunction grown on AlN substrate 被引量:2
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作者 Mussaab I.Niass Muhammad Nawaz Sharif +6 位作者 Yifu Wang Zhengqian Lu Xue Chen Yipu Qu Zhongqiu Du Fang Wang Yuhuai Liu 《Journal of Semiconductors》 EI CAS CSCD 2019年第12期126-129,共4页
In this paper,an ultraviolet C-band laser diode lasing at 277 nm composed of B0.313Ga0.687N/B0.40Ga0.60N QW/QB heterostructure on Mg and Si-doped AlxGa1-xN layers was designed,as well as a lowest reported substitution... In this paper,an ultraviolet C-band laser diode lasing at 277 nm composed of B0.313Ga0.687N/B0.40Ga0.60N QW/QB heterostructure on Mg and Si-doped AlxGa1-xN layers was designed,as well as a lowest reported substitutional accepter and donor concentration up to NA=5.0×10^17 cm^-3 and ND=9.0×10^16 cm^-3 for deep ultraviolet lasing was achieved.The structure was assumed to be grown over bulk AIN substrate and operate under a continuous wave at room temperature.Although there is an emphasizing of the suitability for using boron nitride wide band gap in the deep ultraviolet region,there is still a shortage of investigation about the ternary BGaN in aluminum-rich AIGaN alloys.Based on the simulation,an average local gain in quantum wells of 1946 cm^-1,the maximum emitted power of 2.4 W,the threshold current of 500 mA,a slope efficiency of 1.91 W/A as well as an average DC resistance for the V-I curve of(0.336Ω)had been observed.Along with an investigation regarding different EBL,designs were included with tapered and inverse tapered structure.Therefore,it had been found a good agreement with the published results for tapered EBL design,with an overweighting for a proposed inverse tapered EBL design. 展开更多
关键词 laser diodes semiconducting aluminum compounds heterojunction semiconductor devices quantum wells semiconducting ternary compounds
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Structural, Optical and Electrical Properties of Li-doped ZnO Thin Films Influenced by Annealing Temperature 被引量:1
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作者 王冰 TANG Lidan +1 位作者 PENG Shujing WANG Jianzhong 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2014年第5期873-876,共4页
Li-doped ZnO thin films had been grown by radio frequency magnetron sputtering and then annealed under various annealing temperatures. The characteristics of ZnO films were examined by XRD, FESEM, Hall measurement and... Li-doped ZnO thin films had been grown by radio frequency magnetron sputtering and then annealed under various annealing temperatures. The characteristics of ZnO films were examined by XRD, FESEM, Hall measurement and optical transmission spectra. Results showed that p type conduction was observed in Li doped ZnO films annealed at 500-600 ℃ and thep type ZnO films possessed a good crystalline with c-axis orientation, dense surface, and average transmission of about 85% in visible spectral region. 展开更多
关键词 doping defects physical vapor deposition processes OXIDES semiconducting Ⅱ-Ⅵmaterials heterojunction semiconductor devices
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