The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope （AFM）. The roughness ...The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope （AFM）. The roughness measured by this new method can reach the order of angstroms with high quality capillaries.展开更多
基金supported by the Natural Science Foundation of Beijing,China (Grant No. 1102019)the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20100003120010)
文摘The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope （AFM）. The roughness measured by this new method can reach the order of angstroms with high quality capillaries.
