期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Comprehensive study of the ultrafast photoexcited carrier dynamics in Sb_(2)Te_(3)–GeTe superlattices
1
作者 叶之江 金钻明 +7 位作者 蒋叶昕 卢琦 贾梦辉 钱冬 黄夏敏 李舟 彭滟 朱亦鸣 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第7期381-387,共7页
Chalcogenide superlattices Sb_(2)Te_(3)-GeTe is a candidate for interfacial phase-change memory(iPCM) data storage devices.By employing terahertz emission spectroscopy and the transient reflectance spectroscopy togeth... Chalcogenide superlattices Sb_(2)Te_(3)-GeTe is a candidate for interfacial phase-change memory(iPCM) data storage devices.By employing terahertz emission spectroscopy and the transient reflectance spectroscopy together,we investigate the ultrafast photoexcited carrier dynamics and current transients in Sb_(2)Te_(3)-GeTe superlattices.Sample orientation and excitation polarization dependences of the THz emission confirm that ultrafast thermo-electric,shift and injection currents contribute to the THz generation in Sb_(2)Te_(3)-GeTe superlattices.By decreasing the thickness and increasing the number of GeTe and Sb_(2)Te_(3) layer,the interlayer coupling can be enhanced,which significantly reduces the contribution from circular photo-galvanic effect(CPGE).A photo-induced bleaching in the transient reflectance spectroscopy probed in the range of~1100 nm to~1400 nm further demonstrates a gapped state resulting from the interlayer coupling.These demonstrates play an important role in the development of iPCM-based high-speed optoelectronic devices. 展开更多
关键词 Sb_(2)Te_(3)/GeTe superlattices ultrafast carrier dynamics interfacial phase change memory THz emission spectroscopy transient reflectance spectroscopy
下载PDF
Van der Waals interfacial bonding and intermixing in GeTe-Sb2Te3-based superlattices 被引量:1
2
作者 Andriy Lotnyk Isom Hilmi +1 位作者 Ulrich Ross Bernd Rauschenbach 《Nano Research》 SCIE EI CAS CSCD 2018年第3期1676-1686,共11页
Interfacial phase change memory (iPCM) based on GeTe and Sb2Te3 superlattices (SLs) is an emerging contender for non-volatile data storage applications. A detailed knowledge of the atomic structure of these materi... Interfacial phase change memory (iPCM) based on GeTe and Sb2Te3 superlattices (SLs) is an emerging contender for non-volatile data storage applications. A detailed knowledge of the atomic structure of these materials is crucial for further development of SLs and for a better understanding of the resistivity switching characteristics of iPCM devices. In this work, crystalline GeTe-Sb2TeB- based SLs, produced by pulsed laser deposition onto a Si(111) substrate at temperatures lower than in previous studies, are analyzed by advanced scanning transmission electron microscopy. The results reveal the formation of Ge-rich Ge(x+y)Sb(2-y)Tez building blocks with specific numbers of ordered Ge cation layers (between I and 5) and disordered cation layers (4) for z = 6-10, as well as intermixed cation layers for z = 5, within the SLs. The G Ge(x+y)Sb(2-y)Tez units are separated from the Sb2Te3 building blocks by van der Waals gaps. In particular, the interlayer bonding is promoted by the formation of outermost cation layers consisting of intermixed GeSb within the building blocks adjacent to the van der Waals gaps. The Ge(x+y)Sb(2-y)Tez units with z 〉 5 retain metastable crystal structures with two-dimensional bonding within the SLs. The present study shed new light on the possible configurations of the building units that can be formed during the synthesis of GeTe-Sb2Te3-based iPCM materials. In addition, a possible switching mechanism active in iPCM materials is discussed. 展开更多
关键词 interfacial phase change memory (iPCM) thin films INTERMIXING Cs-corrected scanningtransmission electron microscopy
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部