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Energy capability enhancement for isolated extended drain NMOS transistors
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作者 Nie Weidong Wu Jin +1 位作者 Ma Xiaohui Yu Zongguang 《Journal of Semiconductors》 EI CAS CSCD 2012年第2期45-50,共6页
Isolated extended drain NMOS(EDNMOS) transistors are widely used in power signal processing.The hole current induced by a high electric field can result in a serious reliability problem due to a parasitic NPN effect... Isolated extended drain NMOS(EDNMOS) transistors are widely used in power signal processing.The hole current induced by a high electric field can result in a serious reliability problem due to a parasitic NPN effect. By optimizing p-type epitaxial(p-epi) thickness,n-type buried layer(BLN) and nwell doping distribution,the peak electric field is decreased by 30%and the peak hole current is decreased by 60%,which obviously suppress the parasitic NPN effect.Measured I-V characteristics and transmission line pulsing(TLP) results show that the onstate breakdown voltage is increased from 28 to 37 V when 6 V Vgs is applied and the energy capability is improved by about 30%,while the on-state resistance remains unchanged. 展开更多
关键词 energy capability isolated extended drain nmos transistors safe operating area parasitic NPN TLP on-state breakdown voltage
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