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An Effective On-line Surface Particles Inspection Instrument for Large Aperture Optical Element 被引量:4
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作者 Wen-Dong Ding Zheng-Tao Zhang +5 位作者 Da-Peng Zhang De Xu Hai-Bing Lv Xin-Xiang Miao Guo-Rui Zhou Hao Liu 《International Journal of Automation and computing》 EI CSCD 2017年第4期420-431,共12页
Surface particles growing in large aperture optical element (LAOE) have significant impact on LAOE's stable operation. It is a challenge for the online system to inspect the particles with long working distance, en... Surface particles growing in large aperture optical element (LAOE) have significant impact on LAOE's stable operation. It is a challenge for the online system to inspect the particles with long working distance, enough precision and high efficiency because of the system constraints. In this paper, an effective and portable inspection instrument is designed based on dark-field imaging principle. A Nikon lens and an industrial high definition (HD) camera are selected to construct the vision system to inspect particles of microns size spreading over hundreds of millimeters. Using two motors and other mechanical structure, the system can realize auto-focus and image rectification functions. The line light sources are installed on both sides of the LAOE in a sealed box while the vision system is portable and working outside the box. An adaptive binarization method is proposed to process the captured dark-field image. The distribution of particles on the LAOE's surface is investigated. Because of the high resolution of the captured image, the SSE2 instructions optimization method is used to reduce the time cost of the algorithm. Experiments show that the instrument can inspect LAOE effectively and accurately. 展开更多
关键词 Dark-field imaging image rectification adaptive binarization particle inspection large aperture optical elements(LAOE).
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