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Laser ultrasonic testing for near-surface defects inspection of 316L stainless steel fabricated by laser powder bed fusion 被引量:3
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作者 Ting Dai Xiao-jian Jia +6 位作者 Jun Zhang Jin-feng Wu Yi-wei Sun Shu-xian Yuan Guan-bing Ma Xiao-jing Xiong Hui Ding 《China Foundry》 SCIE CAS 2021年第4期360-368,共9页
The laser powder bed fusion(L-PBF)method of additive manufacturing(AM)is increasingly used in various industrial manufacturing fields due to its high material utilization and design freedom of parts.However,the parts ... The laser powder bed fusion(L-PBF)method of additive manufacturing(AM)is increasingly used in various industrial manufacturing fields due to its high material utilization and design freedom of parts.However,the parts produced by L-PBF usually contain such defects as crack and porosity because of the technological characteristics of L-PBF,which affect the quality of the product.Laser ultrasonic testing(LUT)is a potential technology for on-line testing of the L-PBF process.It is a non-contact and non-destructive approach based on signals from abundant waveforms with a wide frequency-band.In this study,a method of LUT for on-line inspection of L-PBF process was proposed,and a system of LUT was established approaching the actual environment of on-line detection to evaluate the method applicability for defects detection of L-PBF parts.The detection results of near-surface defects in L-PBF 316L stainless steel parts show that the crack-type defects with a sub-millimeter level within 0.5 mm depth can be identified,and accordingly,the positions and dimensions information can be acquired.The results were verified by X-ray computed tomography,which indicates that the present method exhibits great potential for on-line inspection of AM processes. 展开更多
关键词 additive manufacturing 316L stainless steel on-line inspection laser ultrasonic testing non-destructive testing
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THE SIGNIFICANCE OF TESTING PREOPERATIVE VISUAL FUNCTION IN CATARACT USING LASER INTERFEROMETRIC VISUAL ACUITY AND ERG 被引量:2
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作者 De-Zheng Wu Lezheng Wu Xijing Xu Hui Chen Taiqing Luo Zhongshan Ophthalmic Center Sun Yat-sen University of Medical Sciences Guangzhou 510060, China 《眼科学报》 1991年第1期21-24,共4页
Tests of preoperative visual function and prediction of postoperative E chart visual acuity(ECVA) using laser interferometric visual acuity(LIVA) and electroretinogram(ERG) were performed in 16 cases(19 eyes) of catar... Tests of preoperative visual function and prediction of postoperative E chart visual acuity(ECVA) using laser interferometric visual acuity(LIVA) and electroretinogram(ERG) were performed in 16 cases(19 eyes) of cataract. The results showed that the coincident rate between preoperative LIVA and postoperative ECVA was 63.2%, and there was a parallel correlation between preoperative amplitude of photopic ERG b-wave and postoperative ECVA in 79.0% of the eyes. Comparing these two methods, the test of LIVA ... 展开更多
关键词 THE SIGNIFICANCE OF testing PREOPERATIVE VISUAL FUNCTION IN CATARACT USING laser INTERFEROMETRIC VISUAL ACUITY AND ERG
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Estimation of pulsed laser-induced single event transient in a partially depleted silicon-on-insulator 0.18-μm MOSFET 被引量:6
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作者 毕津顺 曾传滨 +3 位作者 高林春 刘刚 罗家俊 韩郑生 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第8期631-635,共5页
In this paper, we investigate the single event transient (SET) occurring in partially depleted silicon-on-insulator (PDSOI) metal-oxide-semiconductor (MOS) devices irradiated by pulsed laser beams. Transient sig... In this paper, we investigate the single event transient (SET) occurring in partially depleted silicon-on-insulator (PDSOI) metal-oxide-semiconductor (MOS) devices irradiated by pulsed laser beams. Transient signal characteristics of a 0.18-p.m single MOS device, such as SET pulse width, pulse maximum, and collected charge, are measured and an- alyzed at wafer level. We analyze in detail the influences of supply voltage and pulse energy on the SET characteristics of the device under test (DUT). The dependences of SET characteristics on drain-induced barrier lowering (DIBL) and the parasitic bipolar junction transistor (PBJT) are also discussed. These results provide a guide for radiation-hardened deep sub-micrometer PDSOI technology for space electronics applications. 展开更多
关键词 laser test single event transient charge collection partially depleted silicon on insulator
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