It is well known that Fleming-Viot superprocesses can be obtained from the Dawson-Watanabe superprocesses by conditioning the latter to have constant total mass. The same question is investigated for measure-valued br...It is well known that Fleming-Viot superprocesses can be obtained from the Dawson-Watanabe superprocesses by conditioning the latter to have constant total mass. The same question is investigated for measure-valued branching processes with interacting intensity independent of the geographical position. It is showed that a sequence of conditioned probability laws of this kind of interacting measure-valued branching processes also approximates to the probability law of Fleming-Viot superprocesses.展开更多
With the relentless densification of interconnected circuitry dictated by Moore’ s Law,the CMP manufacture of such delicate wafers requires the significant reduction of polishing pressure of integrated circuits,not o...With the relentless densification of interconnected circuitry dictated by Moore’ s Law,the CMP manufacture of such delicate wafers requires the significant reduction of polishing pressure of integrated circuits,not only globally,but also locally on every tip of the pad asperities.Conventional diamond disks used for dressing the polyurethane pads cannot produce asperities to achieve such uniformity.A new design of diamond disk was fabricated by casting diamond film on a silicon wafer that contains patterned etching pits. This silicon mold was subsequently removed by dissolution in a hydroxide solution.The diamond film followed the profile of the etching pits on silicon to form pyramids of identical in size and shape.The variation of their tip heights was in microns of single digit that was about one order of magnitude smaller than conventional diamond disks for CMP production.Moreover,the diamond film contained no metal that might contaminate the circuits on polished wafer during a CMP operation.The continuous diamond film could resist any corrosive attack by slurry of acid or base.Consequently,in-situ dressing during CMP is possible that may improve wafer uniformity and production throughput.This ideal diamond disk(IDD) is designed for the future manufacture of advanced semiconductor chips with node sizes of 32 nm or smaller.展开更多
We study the conditional limit theorems for critical continuous-state branching processes with branching mechanism Ф（λ） = λ 1＋αL（1/λ）, where （α∈ [0, 1] and L is slowly varying at co. We prove that if α ...We study the conditional limit theorems for critical continuous-state branching processes with branching mechanism Ф（λ） = λ 1＋αL（1/λ）, where （α∈ [0, 1] and L is slowly varying at co. We prove that if α ∈ （0, 1], there are norming constants Qt →0 （as t ↑ ＋ ∞） such that for every x 〉 0, Px（QtXt ∈ · ｜Xt 〉 0） converges weakly to a non-degenerate limit. The converse assertion is also true provided the regularity of ψ at 0. We give a conditional limit theorem for the case α = 0. The limit theorems we obtain in this paper allow infinite variance of the branching process.展开更多
文摘It is well known that Fleming-Viot superprocesses can be obtained from the Dawson-Watanabe superprocesses by conditioning the latter to have constant total mass. The same question is investigated for measure-valued branching processes with interacting intensity independent of the geographical position. It is showed that a sequence of conditioned probability laws of this kind of interacting measure-valued branching processes also approximates to the probability law of Fleming-Viot superprocesses.
文摘With the relentless densification of interconnected circuitry dictated by Moore’ s Law,the CMP manufacture of such delicate wafers requires the significant reduction of polishing pressure of integrated circuits,not only globally,but also locally on every tip of the pad asperities.Conventional diamond disks used for dressing the polyurethane pads cannot produce asperities to achieve such uniformity.A new design of diamond disk was fabricated by casting diamond film on a silicon wafer that contains patterned etching pits. This silicon mold was subsequently removed by dissolution in a hydroxide solution.The diamond film followed the profile of the etching pits on silicon to form pyramids of identical in size and shape.The variation of their tip heights was in microns of single digit that was about one order of magnitude smaller than conventional diamond disks for CMP production.Moreover,the diamond film contained no metal that might contaminate the circuits on polished wafer during a CMP operation.The continuous diamond film could resist any corrosive attack by slurry of acid or base.Consequently,in-situ dressing during CMP is possible that may improve wafer uniformity and production throughput.This ideal diamond disk(IDD) is designed for the future manufacture of advanced semiconductor chips with node sizes of 32 nm or smaller.
基金supported by National Natural Science Foundation of China(Grant Nos.11271030 and 11128101)Specialized Research Fund for the Doctoral Program of Higher Education and China Postdoctoral Science Foundation(Grant No.2013M541061)
文摘We study the conditional limit theorems for critical continuous-state branching processes with branching mechanism Ф（λ） = λ 1＋αL（1/λ）, where （α∈ [0, 1] and L is slowly varying at co. We prove that if α ∈ （0, 1], there are norming constants Qt →0 （as t ↑ ＋ ∞） such that for every x 〉 0, Px（QtXt ∈ · ｜Xt 〉 0） converges weakly to a non-degenerate limit. The converse assertion is also true provided the regularity of ψ at 0. We give a conditional limit theorem for the case α = 0. The limit theorems we obtain in this paper allow infinite variance of the branching process.
