Full lifetime demonstration of a Micro-Cathode-Arc thruster evolution characteristics

Ground lifetime test is the most crucial experiment to assess the performance,reliability.and flight qualification of electric propulsion,and it can bring new insights for understanding the operation characteristics.This work demonstrates a full lifetime test of 140000 cycles on a Micro-Cathode-Arc Thruster(μCAT)with 160μs charging time and 86 mJ charging energy.A four-probe resistivity measurement method is utilized to investigate variations in the conductive film thickness and resistivity throughout the thruster lifespan.Direct film parameters show that the lifetime of theμCAT can be divided into three stages.In the initial stage,the film thickness decreases by 1.2μm and the resistivity increases significantly due to the high discharge intensity and intense film ablation;In the steady stage,the change of the film thickness is within 5%,and the resistivity of the film increases slowly from 0.050Ω·mm to 0.223Ω·mm.In the end stage,the resistivity exponentially increases from 0.223Ω·mm to 1.176Ω·mm,with the increase accounting for 81%,ultimately resulting in the failure of the thruster open circuit.Additionally,the evolution of discharge parameters,and the variation of plume parameters are measured throughout the life-time.The discharge characteristics also show significant differences in the duration of voltage and current in these three stages.The results of plume shape and plasma parameters are also well con-sistent with the discharge parameters and film state.These results suggest that,for evaluating the steady stage lifetime of thrusters,the film thickness is the best indicator compared to the variations in resistivity and voltage-current characteristics.For the end stage,the plasma plume morphology.discharge duration,and plume parameters can conveniently and clearly characterize the thruster failures and irregularity.

IEC 62059 Standards' Application in Reliability Prediction and Verification of Smart Meters

This article introduces the current situation of the smart then describes the relationship of meter reliability characteristics meter＇s reliability and the failure mechanisms at first, and combined with its Bathtub Curve. It also introduces both the feasible failure tree model for meter lifecycle prediction based on actual experiences and meter reliability prediction methodology by SN 29500 norms based on this model. This article also brings forward that it is necessary that the ＂Learning Factor＂ shall be adopted in meter reliability prediction for new materials, new process, and customized parts by referring to GJB/Z299C. Thereafter, this article also tries to apply IEC 62059 and JB/T 50070 to introduce the feasible method for the lifecycle prediction result verification by accelerated lifecycle test. Furthermore, the article also explores ways to increase the firmware reliability in smart meter.

Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It is essential to carry out the reliability modeling and predict the lifetime. In the present work, the accelerated lifetime testing method which is on account of the uniform design method was designed to obtain the degradation data under multiple environmental stresses of temperature and particulate contamination for electrical connectors. Based on the degradation data, the pseudo life can be acquired. Then the reliability model was established by analyzing the pseudo life. Accordingly, the reliability function and reliable lifetime function were set up, and the reliable lifetime of the connectors under the multiple environment stresses of temperature and particulate contamination could be predicted for electrical connectors,

Rapid evaluation method for the normal lifetime of an infrared light-emitting diode

： Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy

Statistical Inference for a Simple Step Stress Model with Competing Risks Based on Generalized Type-ⅠHybrid Censoring

This paper investigates a simple step-stress accelerated lifetime test(SSALT)model for the inferential analysis of exponential competing risks data.A generalized type-I hybrid censoring scheme is employed to improve the efficiency and controllability of the test.Firstly,the MLEs for parameters are established based on the cumulative exposure model(CEM).Then the conditional moment generating function(MGF)for unknown parameters is set up using conditional expectation and multiple integral techniques.Thirdly,confidence intervals(CIs)are constructed by the exact MGF-based method,the approximate normality-based method,and the bias-corrected and accelerated(BCa)percentile bootstrap method.Finally,we present simulation studies and an illustrative example to compare the performances of different methods.