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Single-peak distribution model of particulate size for welding aerosols
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作者 施雨湘 李爱农 《China Welding》 EI CAS 2003年第1期45-49,共5页
A large number of particulate size distributions of welding aerosols are measured by means of DMPS method, several distribution types are presented. Among them the single peak distribution is the basic composing unit... A large number of particulate size distributions of welding aerosols are measured by means of DMPS method, several distribution types are presented. Among them the single peak distribution is the basic composing unit of particulate size. The research on the mathematic models and distributions functions shows that the single peak distribution features the log normal distribution. The diagram estimating method (DEM) is a concise approach to dealing with distribution types, obtaining distribution functions for the particulate sizes of welding aerosols. It proves that the distribution function of particulate size possesses the extending property, being from quantity distribution to volume, as well as high order moment distributions, with K S method verifying the application of single peak distribution and of DEM. 展开更多
关键词 welding aerosols distribution function log normal distribution diagram estimating method (DEM) welding fume
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Mathematical Insight into Moderate Inversion Gate Delay Variability for Ultradeep Submicron Digital Circuit Design
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作者 Shruti Kalra 《Journal of Harbin Institute of Technology(New Series)》 CAS 2023年第4期68-75,共8页
Voltage scaling has been extensively used in industry for decades to reduce power consumption.In recent years,exploring digital circuit operation in moderate inversion has created an interest among researchers due to ... Voltage scaling has been extensively used in industry for decades to reduce power consumption.In recent years,exploring digital circuit operation in moderate inversion has created an interest among researchers due to its immense capability to provide a perfect tradeoff between high performance and low energy operation.But circuits operating in moderate inversion are susceptible to process variations and variability.To compute variability,statistical parameters such as the probability density function(PDF)and cumulative distribution function(CDF)are required.This paper presents an analytical model framework for delay calculations utilizing log skew normal distribution for ultradeep submicron technology nodes up to 22 nm.The CDF of the proposed model is utilized to calculate minimum and maximum delays with 3σ-accuracy providing better accuracy than the conventional methods.The obtained results are also compared with Monte Carlo simulations with errors lying within the acceptable range of 2%-4%. 展开更多
关键词 moderate inversion ultradeep submicron predictive technology model VARIABILITY log skew normal distribution
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