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Photoelectrochemical etching of uniform macropore array on full 5-inch silicon wafers
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作者 赵志刚 郭金川 +1 位作者 雷耀虎 牛憨笨 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第7期156-160,共5页
We analyze the two main factors causing non-uniformity of the etched macropore array first,and then a novel photoelectrochemical etching setup for large area silicon wafers is described.This etching setup refined typi... We analyze the two main factors causing non-uniformity of the etched macropore array first,and then a novel photoelectrochemical etching setup for large area silicon wafers is described.This etching setup refined typical etching setups by a water cooling system and a shower-head shaped electrolyte circulator.Experimental results showed that the uniform macropore array on full 5-inch n-type silicon wafers could be fabricated by this etching setup.The morphology of the macropore array can be controlled by adjusting the corresponding etching parameters. 展开更多
关键词 photoelectrochemical etching macropore array large area NON-UNIFORMITY current density
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