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A Model for Mechanical Property Evaluation of the Periodic Porous Low-k Materials by SAW
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作者 李志国 姚素英 +1 位作者 肖夏 白茂森 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第11期1722-1728,共7页
The influence of the distribution of nano-pores on the mechanical properties evaluation of porous low-k films by surface acoustic waves (SAW) is studied. A theoretical SAW propagation model is set up to characterize... The influence of the distribution of nano-pores on the mechanical properties evaluation of porous low-k films by surface acoustic waves (SAW) is studied. A theoretical SAW propagation model is set up to characterize the periodic porous dielectrics by transversely isotropic symmetry. The theoretical deductions of SAW propagating in the low-k film/Si substrate layered structure are given in detail. The dispersive characteristics of SAW in differ- ent propagation directions and the effects of the Young's moduli E, E′ and shear modulus G′ of the films on these dispersive curves are found. Computational results show that E′ and G′ cannot be measured along the propagation direction that is perpendicular to the nano-pores' direction. 展开更多
关键词 periodic porous materials low-k dielectrics transversely isotropic symmetry mechanical proper ty SAW measurement
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