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Studies of Atomic Structure and Physical Properties of Metal Clusters in MgO by HREM and Nano-probe Methods
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作者 Nobuo Tanaka (Dept. of Applied Physics, School of Engineering, Nagoya University, Nagoya, 464-01, Japan) 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 1997年第4期265-270,共6页
Nanometer-sized metal clusters were prepared inside single crystalline MgO films by vacuum co-deposition of metals and MgO. The atomic structure was studied by high-resolution electron microscopy (HREM) and nm-area el... Nanometer-sized metal clusters were prepared inside single crystalline MgO films by vacuum co-deposition of metals and MgO. The atomic structure was studied by high-resolution electron microscopy (HREM) and nm-area electron diffraction. The size of the clusters is ranging from 1 nm to 3 nm without those larger than 5 nm, and most of them have definite epitaxial orientations with the MgO matrix films. The character of the composite films is very much useful for the studies of various kinds of physical properties with anisotroPy. The physical properties such as electric transport, magnetic, optical absorption, sintering and catalytic ones were thus measured on the same samples analyzed by HREM by using high sensitivity apparatus with interest of clarifying the retationship between the atomic structure and physical properties 展开更多
关键词 FIGURE NANO Studies of Atomic Structure and Physical Properties of metal Clusters in MgO by HREM and Nano-probe Methods HREM MGO
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A synthetic semi-empirical physical model of secondary electron yield of metals under E-beam irradiation
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作者 封国宝 崔万照 +2 位作者 张娜 曹猛 刘纯亮 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第9期459-466,共8页
Calculations of secondary electron yield(SEY) by physical formula can hardly accord with experimental results precisely. Simplified descriptions of internal electron movements in the calculation and complex surface ... Calculations of secondary electron yield(SEY) by physical formula can hardly accord with experimental results precisely. Simplified descriptions of internal electron movements in the calculation and complex surface contamination states of real sample result in notable difference between simulations and experiments. In this paper, in order to calculate SEY of metal under complicated surface state accurately, we propose a synthetic semi-empirical physical model. The processes of excitation of internal secondary electron(SE) and movement toward surface can be simulated using this model.This model also takes into account the influences of incident angle and backscattering electrons as well as the surface gas contamination. In order to describe internal electronic states accurately, the penetration coefficient of incident electron is described as a function of material atom number. Directions of internal electrons are set to be uniform in each angle. The distribution of internal SEs is proposed by considering both the integration convergence and the cascade scattering process.In addition, according to the experiment data, relationship among desorption gas quantities, sample ultimate temperature and SEY is established. Comparing with experiment results, this synthetic semi-empirical physical model can describe the SEY of metal better than former formulas, especially in the aspect of surface contaminated states. The proposed synthetic semi-empirical physical model and presented results in this paper can be helpful for further studying SE emission, and offer an available method for estimating and taking advantage of SE emission accurately. 展开更多
关键词 secondary electron yield synthetic semi-empirical physical model metal electron irradiation
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