In this paper, we demonstrate a new optical method for tiny strain measurements based on the principle of carrier fringes of moire interferometry. A cross-line grating with frequency of 1200 lp/mm is replicated on the...In this paper, we demonstrate a new optical method for tiny strain measurements based on the principle of carrier fringes of moire interferometry. A cross-line grating with frequency of 1200 lp/mm is replicated on the specimen surface, and the strain can be deduced from the changes in carrier fringes before and after the deformation of an object. Four coherent laser beams are used to obtain the carrier fringe patterns of field U and V. Both theoretical analysis and numerical simulation indicate that the ideal accuracy of strain can be controlled within a range of ±1με. Case study of a plane extension experiment shows that the measurement accuracy of strain can be controlled within the range of ±10με. The average strain values of every row of field U and every column of field V can be obtained by using this method, and approximated strain of every pixel in the whole-field can be further acquired, and thus it is possible to measure tiny strains occurred in a micro-field. The technology in this paper can provide comprehensive information for analyzing related mechanical content in the field of MEMS.展开更多
Modeling of the roughness in micro-nano scale and its influence have not been fully investigated, however the roughness will cause amplitude and phase errors of the radiating slot, and decrease the precision and effic...Modeling of the roughness in micro-nano scale and its influence have not been fully investigated, however the roughness will cause amplitude and phase errors of the radiating slot, and decrease the precision and efficiency of the SWA in Ku-band. Firstly, the roughness is simulated using the electromechanical coupled（EC） model. The relationship between roughness and the antenna＇s radiation properties is obtained. For verification, an antenna proto- type is manufactured and tested, and the simulation method is introduced. According to the prototype, a contrasting experiment dealing with the flatness of the radiating plane is conducted to test the simulation method. The advantage of the EC model is validated by comparisons of the EC model and two classical roughness models （sine wave and fractal function）, which shows that the EC model gives a more accurate description model for roughness, the maxi- mum error is 13%. The existence of roughness strongly broadens the beamwidth and raises the side-lobe level of SWA, which is 1.2 times greater than the ideal antenna. In addition, effect of the EC model＇s evaluation indices is investigated, the most affected scale of the roughness is found, which is 1/10 of the working wavelength. The proposed research provides the instruction for antenna designing and manufacturing.展开更多
基金the Basal Research Funds of National Defence Science and Technology
文摘In this paper, we demonstrate a new optical method for tiny strain measurements based on the principle of carrier fringes of moire interferometry. A cross-line grating with frequency of 1200 lp/mm is replicated on the specimen surface, and the strain can be deduced from the changes in carrier fringes before and after the deformation of an object. Four coherent laser beams are used to obtain the carrier fringe patterns of field U and V. Both theoretical analysis and numerical simulation indicate that the ideal accuracy of strain can be controlled within a range of ±1με. Case study of a plane extension experiment shows that the measurement accuracy of strain can be controlled within the range of ±10με. The average strain values of every row of field U and every column of field V can be obtained by using this method, and approximated strain of every pixel in the whole-field can be further acquired, and thus it is possible to measure tiny strains occurred in a micro-field. The technology in this paper can provide comprehensive information for analyzing related mechanical content in the field of MEMS.
基金Supported by National Natural Science Foundation of China(Grant Nos.51305322,51405364,51475348)
文摘Modeling of the roughness in micro-nano scale and its influence have not been fully investigated, however the roughness will cause amplitude and phase errors of the radiating slot, and decrease the precision and efficiency of the SWA in Ku-band. Firstly, the roughness is simulated using the electromechanical coupled（EC） model. The relationship between roughness and the antenna＇s radiation properties is obtained. For verification, an antenna proto- type is manufactured and tested, and the simulation method is introduced. According to the prototype, a contrasting experiment dealing with the flatness of the radiating plane is conducted to test the simulation method. The advantage of the EC model is validated by comparisons of the EC model and two classical roughness models （sine wave and fractal function）, which shows that the EC model gives a more accurate description model for roughness, the maxi- mum error is 13%. The existence of roughness strongly broadens the beamwidth and raises the side-lobe level of SWA, which is 1.2 times greater than the ideal antenna. In addition, effect of the EC model＇s evaluation indices is investigated, the most affected scale of the roughness is found, which is 1/10 of the working wavelength. The proposed research provides the instruction for antenna designing and manufacturing.
