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High Growth Rate of Microcrystalline Silicon Films Prepared by ICP-CVD with Internal Low Inductance Antennas
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作者 陈玖香 王伟仲 +1 位作者 Jyh Shiram CHERNG 陈强 《Plasma Science and Technology》 SCIE EI CAS CSCD 2014年第5期502-505,共4页
The plasma parameters in ICP-CVD system with internal low inductance antennas(LIA) were diagnosed by Langmuir probe.The ions density(Ni) reached 10^(11)-10^(12) cm^(-3),and the electron temperature(T_e) was below ca.2... The plasma parameters in ICP-CVD system with internal low inductance antennas(LIA) were diagnosed by Langmuir probe.The ions density(Ni) reached 10^(11)-10^(12) cm^(-3),and the electron temperature(T_e) was below ca.2 eV,which was slightly decreased with applied power.A p-type hydrogenated microcrystalline silicon(μc-Si:H) film was prepared on glass substrate.After optimization of the processing parameters in flow ratio of SiH_4:B_2H_6:H_2,a high quality μc-Si:H film with deposition rate above 1.0 nm/s was achieved in this work. 展开更多
关键词 ICP-CVD plasma parameters microcrystalline silicon films deposition rate
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Effects of growth temperature on μc-Si:H films prepared by plasma assistant magnetron sputtering 被引量:3
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作者 Su, Yuanjun Dond, Chuang +2 位作者 Zhu, Ming Xu, Jun Fan, Penghui 《Rare Metals》 SCIE EI CAS CSCD 2012年第2期193-197,共5页
Hydrogenated microcrystalline silicon thin films (μc-Si:H) were deposited by plasma assistant magnetron sputtering in Ar-H 2 gas mixture. The effects of growth temperature from 150 to 450 C on properties of deposited... Hydrogenated microcrystalline silicon thin films (μc-Si:H) were deposited by plasma assistant magnetron sputtering in Ar-H 2 gas mixture. The effects of growth temperature from 150 to 450 C on properties of deposited Si films were investigated at two different hydrogen diluted gases with [H 2 ]/([Ar]+[H 2 ]) of 10% and 50% at 3 Pa. The crystallinity of Si films examined by Raman scattering exhibited higher degrada- tion by lowering growth temperature from 250 to 150 C in low hydrogen diluted gas of 10% than that in high hydrogen diluted gas of 50%. The IR absorption band around 845 and 890 cm 1 as well as calculated concentration of bonded hydrogen showed more obvious decrease of samples deposited in low hydrogen diluted gas of 10% than that in high hydrogen diluted gas of 50%. The optical band gasps of both groups of samples measured by ultraviolet-visible optical absorption were decreased with increasing temperature in both gas conditions. 展开更多
关键词 microcrystalline silicon Raman scattering hydrogen-silicon bonding optical band gap
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