An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy （AFM） here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two hig...An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy （AFM） here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication＇s difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe.展开更多
This paper illuminates the preparation of grating-like polystyrene latex monolayer structure, which can minimize the effects of the size deviation of spheres and the defect transfer on the accuracy as calibration samp...This paper illuminates the preparation of grating-like polystyrene latex monolayer structure, which can minimize the effects of the size deviation of spheres and the defect transfer on the accuracy as calibration samples for micro-scopes. The latex films are grown on freshly cleaved mica substrates by vertical deposition method. The concentration dependence of the structure and the topography of latex films is characterized by optical microscope, ultraviolet- visible transmission spectrum and scanning probe microscope. The origination of such a grating-like structure is also discussed.展开更多
In this paper, three different tips are employed, i.e., the carbon nanotube tip, monocrystalline silicon tip and silicon nitride tip. Resorting to atomic force microscope （AFM）, they are used for measuring the surfa...In this paper, three different tips are employed, i.e., the carbon nanotube tip, monocrystalline silicon tip and silicon nitride tip. Resorting to atomic force microscope （AFM）, they are used for measuring the surface roughness of indium tin oxide （ITO） film and the immunoglobulin G （IgG） proteins within the scanning area of 10 μm×10 μm and 0.5 μm×0.5 μm, respectively. Subsequently, the scanned surface of the ITO film and IgG proteins are analyzed by using fractal dimension. The results show that the ffactal dimension measured by carbon nanotube tip is biggest with the highest frequency components and the most microscopic information. Therefore, the carbon nanotube tip is the ideal measuring tool for measuring super-smooth surface, which will play a more and more important role in the high-resolution imaging field.展开更多
A probe-hole field emission microscope system,controlled by the Apple Ⅱ computer,has been developed and operated successfully for measuring the work function of a single crystalplane.The detection screen,the phototub...A probe-hole field emission microscope system,controlled by the Apple Ⅱ computer,has been developed and operated successfully for measuring the work function of a single crystalplane.The detection screen,the phototube and the amplifier are combined for measuring theprobe-hole current.The combination is calibrated and the calibrated data are used in the com-puter program.The high voltage on the viewing screen is adjusted by using a D/A converter.The total current and the probe-hole current are acquired by using an A/D converter.A programin BASIC is used for processing all data and the Fowler-Nordheim plot parameters are given.Work functions of single crystal planes can then be calculated;as examples,the work functionson the clean W(100)and W(111)planes are measured to be 4.67 eV and 4.45 eV,respectively.展开更多
Scanning Probe Microscopes (SPMs) observe specimen surfaces with probes by detecting the physical amount of a material between the cantilever and the surface. SPMs have a high resolution and can measure mechanical cha...Scanning Probe Microscopes (SPMs) observe specimen surfaces with probes by detecting the physical amount of a material between the cantilever and the surface. SPMs have a high resolution and can measure mechanical characteristics such as stiffness, adsorptive properties, and viscoelasticity. These features make it easy to identify the surface structure of complex materials;therefore, the use of SPMs has increased in recent years. Wood cell walls are primarily composed of cellulose, hemicellulose, and lignin. It is believed that hemicellulose and lignin surround the cellulose framework;however, their detailed formation remains unknown. Therefore, we observed wood cell walls via scanning probe microscopy to try to reveal the formation of the cellulose framework. We determined that the size of the cellulose microfibril bundle and hemicellulose lignin module composite was 18.48 nm based on topography and that the size of the cellulose microfibril bundle was 15.33 nm based on phase images. In the viscoelasticity image, we found that the viscoelasticities of each cell wall of the same cell were not the same. This is because the cellulose microfibrils in each cell wall lean in different directions. The angle between the leaning of the cellulose microfibril and the cantilever affects the viscoelasticity measurement.展开更多
The localized micro-galvanic corrosion process and the kinetic information of Mg-(7,9)Al-1Fe-x Nd alloys were investigated by in situ observation under electrochemical control and in situ atomic force microscopy(AFM)i...The localized micro-galvanic corrosion process and the kinetic information of Mg-(7,9)Al-1Fe-x Nd alloys were investigated by in situ observation under electrochemical control and in situ atomic force microscopy(AFM)in an electrolyte environment.The results revealed that the formation of the Nd-rich phase in alloys resulted in a decrease in the Volta potential difference from~400 m V(AlFe3/α-Mg)to~220 mV(Nd-rich/α-Mg),reducing the corrosion products around the cathodic phase and corrosion current density of the microscale area.The addition of Nd significantly improved the corrosion resistance,mainly due to the suppression of the micro-galvanic corrosion between the second phases and substrate.Finally,the corrosion mechanism of Mg-(7,9)Al-1Fe-x Nd alloys was discussed based on in situ observations and electrochemical results.展开更多
An experimental study on cutting amorphous alloy at nanometer scale is conducted by applying the principle and technology of scanning probe microscope(SPM) It is revealed from the experiments that cutting inside SPM...An experimental study on cutting amorphous alloy at nanometer scale is conducted by applying the principle and technology of scanning probe microscope(SPM) It is revealed from the experiments that cutting inside SPM is an excellent and direct way to research the material removal process at small size Based on the experimental results,the chip formation mechanism for the cutting of amorphous alloy is discussed It is found that the deformation along the direction of chip flow occurs ahead of the appearance of localized shear,and a simplified geometrical model is proposed to illustrate the deformation.展开更多
Several fundamental problems in hydrophobic force measurements using atomic force microscope (AFM) are dis-cussed in this paper. A novel method for colloid probe preparation based on chemical etching technology is pro...Several fundamental problems in hydrophobic force measurements using atomic force microscope (AFM) are dis-cussed in this paper. A novel method for colloid probe preparation based on chemical etching technology is proposed, which is specially fit for the unique demands of hydrophobic force measurements by AFM. The features of three different approaches for determining spring constants of rectangular cantilevers, including geometric dimension, Cleveland and Sader methods are com-pared. The influences of the sizes of the colloids on the measurements of the hydrophobic force curves are investigated. Our experimental results showed that by selecting colloid probe with proper spring constant and tip size, the hydrophobic force and the complete hydrophobic interaction force curve can be measured by using AFM.展开更多
Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical ...Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect.展开更多
An improved arc discharge method is developed to fabricate the carbon nanotube probe. In this method, the silicon probe and the carbon nanotube were manipulated under an optical microscope. When the silicon probe and ...An improved arc discharge method is developed to fabricate the carbon nanotube probe. In this method, the silicon probe and the carbon nanotube were manipulated under an optical microscope. When the silicon probe and the carbon nanotube were very close, 30-60 V dc or ae was applied between them, and the carbon nanotube was divided and attached to the end of the silicon probe. Comparing with the arc discharge method, the new method need not coat the silicon probe with metal in advance, which can greatly reduce the fabrication difficulty and cost. The fabricated carbon nanotube probe exhibits the good property of high aspect ratio and can reflect the true topography more accurately than the silicon probe.展开更多
基金This project is supported by National Natural Science Foundation of China (No.50205006).
文摘An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy （AFM） here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication＇s difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe.
基金supported by Science and Technology Commission of Shanghai Municipality (Grant No 0652NM028)Shanghai Leading Academic Discipline Project of China (B113)the International Research Training Group (IRTG)
文摘This paper illuminates the preparation of grating-like polystyrene latex monolayer structure, which can minimize the effects of the size deviation of spheres and the defect transfer on the accuracy as calibration samples for micro-scopes. The latex films are grown on freshly cleaved mica substrates by vertical deposition method. The concentration dependence of the structure and the topography of latex films is characterized by optical microscope, ultraviolet- visible transmission spectrum and scanning probe microscope. The origination of such a grating-like structure is also discussed.
基金National Natural Science Foundation of China(No.50605012).
文摘In this paper, three different tips are employed, i.e., the carbon nanotube tip, monocrystalline silicon tip and silicon nitride tip. Resorting to atomic force microscope （AFM）, they are used for measuring the surface roughness of indium tin oxide （ITO） film and the immunoglobulin G （IgG） proteins within the scanning area of 10 μm×10 μm and 0.5 μm×0.5 μm, respectively. Subsequently, the scanned surface of the ITO film and IgG proteins are analyzed by using fractal dimension. The results show that the ffactal dimension measured by carbon nanotube tip is biggest with the highest frequency components and the most microscopic information. Therefore, the carbon nanotube tip is the ideal measuring tool for measuring super-smooth surface, which will play a more and more important role in the high-resolution imaging field.
基金Subject Supported by the Natural Science Fund of China.
文摘A probe-hole field emission microscope system,controlled by the Apple Ⅱ computer,has been developed and operated successfully for measuring the work function of a single crystalplane.The detection screen,the phototube and the amplifier are combined for measuring theprobe-hole current.The combination is calibrated and the calibrated data are used in the com-puter program.The high voltage on the viewing screen is adjusted by using a D/A converter.The total current and the probe-hole current are acquired by using an A/D converter.A programin BASIC is used for processing all data and the Fowler-Nordheim plot parameters are given.Work functions of single crystal planes can then be calculated;as examples,the work functionson the clean W(100)and W(111)planes are measured to be 4.67 eV and 4.45 eV,respectively.
文摘Scanning Probe Microscopes (SPMs) observe specimen surfaces with probes by detecting the physical amount of a material between the cantilever and the surface. SPMs have a high resolution and can measure mechanical characteristics such as stiffness, adsorptive properties, and viscoelasticity. These features make it easy to identify the surface structure of complex materials;therefore, the use of SPMs has increased in recent years. Wood cell walls are primarily composed of cellulose, hemicellulose, and lignin. It is believed that hemicellulose and lignin surround the cellulose framework;however, their detailed formation remains unknown. Therefore, we observed wood cell walls via scanning probe microscopy to try to reveal the formation of the cellulose framework. We determined that the size of the cellulose microfibril bundle and hemicellulose lignin module composite was 18.48 nm based on topography and that the size of the cellulose microfibril bundle was 15.33 nm based on phase images. In the viscoelasticity image, we found that the viscoelasticities of each cell wall of the same cell were not the same. This is because the cellulose microfibrils in each cell wall lean in different directions. The angle between the leaning of the cellulose microfibril and the cantilever affects the viscoelasticity measurement.
基金financial support from the National Natural Science Foundation of China(No.51961026)。
文摘The localized micro-galvanic corrosion process and the kinetic information of Mg-(7,9)Al-1Fe-x Nd alloys were investigated by in situ observation under electrochemical control and in situ atomic force microscopy(AFM)in an electrolyte environment.The results revealed that the formation of the Nd-rich phase in alloys resulted in a decrease in the Volta potential difference from~400 m V(AlFe3/α-Mg)to~220 mV(Nd-rich/α-Mg),reducing the corrosion products around the cathodic phase and corrosion current density of the microscale area.The addition of Nd significantly improved the corrosion resistance,mainly due to the suppression of the micro-galvanic corrosion between the second phases and substrate.Finally,the corrosion mechanism of Mg-(7,9)Al-1Fe-x Nd alloys was discussed based on in situ observations and electrochemical results.
基金This project is supported by Foundation of National Education Ministry for Returned Overseas Chinese Scholars(No.2000367) an
文摘An experimental study on cutting amorphous alloy at nanometer scale is conducted by applying the principle and technology of scanning probe microscope(SPM) It is revealed from the experiments that cutting inside SPM is an excellent and direct way to research the material removal process at small size Based on the experimental results,the chip formation mechanism for the cutting of amorphous alloy is discussed It is found that the deformation along the direction of chip flow occurs ahead of the appearance of localized shear,and a simplified geometrical model is proposed to illustrate the deformation.
基金Project (No. 20276057) supported by the National Natural ScienceFoundation of China
文摘Several fundamental problems in hydrophobic force measurements using atomic force microscope (AFM) are dis-cussed in this paper. A novel method for colloid probe preparation based on chemical etching technology is proposed, which is specially fit for the unique demands of hydrophobic force measurements by AFM. The features of three different approaches for determining spring constants of rectangular cantilevers, including geometric dimension, Cleveland and Sader methods are com-pared. The influences of the sizes of the colloids on the measurements of the hydrophobic force curves are investigated. Our experimental results showed that by selecting colloid probe with proper spring constant and tip size, the hydrophobic force and the complete hydrophobic interaction force curve can be measured by using AFM.
基金Sponsored by the National Natural Science Foundation of China (Grant No. 50202006)the Multidisciline Scientific Research Foundation of Harbin Institute of Technology (Grant No. HIT. MD. 2001.04)
文摘Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect.
基金Sponsored by the National Natural Science Foundation of China(Grant No.50205006)
文摘An improved arc discharge method is developed to fabricate the carbon nanotube probe. In this method, the silicon probe and the carbon nanotube were manipulated under an optical microscope. When the silicon probe and the carbon nanotube were very close, 30-60 V dc or ae was applied between them, and the carbon nanotube was divided and attached to the end of the silicon probe. Comparing with the arc discharge method, the new method need not coat the silicon probe with metal in advance, which can greatly reduce the fabrication difficulty and cost. The fabricated carbon nanotube probe exhibits the good property of high aspect ratio and can reflect the true topography more accurately than the silicon probe.
