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Recent Developments in Magnetron Sputtering 被引量:1
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作者 于翔 王成彪 +2 位作者 刘阳 于德洋 邢廷炎 《Plasma Science and Technology》 SCIE EI CAS CSCD 2006年第3期337-343,共7页
The principle of magnetron sputtering is introduced andthe balanced and unbalanced magnetrons are compared andthe necessity of unbalanced magnetrons is explained as well. Several recent developments in plasma magnetro... The principle of magnetron sputtering is introduced andthe balanced and unbalanced magnetrons are compared andthe necessity of unbalanced magnetrons is explained as well. Several recent developments in plasma magnetron sputtering, i.e., unbalanced magnetron sputtering, pulsed magnetron sputtering and ion assisted sputtering, are discussed. The recent developments of unbalanced magnetron systems and their incorporation with ion sources result in an understanding in growingimportance of the magnetron sputtering technology, which makes the technology an applicable deposition process for a variety of important films, such as wear-resistant films and decorative films. 展开更多
关键词 balanced and unbalanced magnetron sputtering mid-frequency magnetron sputtering ion assisted sputtering
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Effect of sputtering conditions on growth and properties of ZnO :Al films
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作者 石倩 代明江 +3 位作者 林松盛 侯惠君 韦春贝 胡芳 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2015年第5期1517-1524,共8页
Al-doped zinc oxide(AZO) films were deposited on glass substrates by mid-frequency magnetron sputtering. The effects of substrate rotation speed and target-substrate distance on the electrical, optical properties an... Al-doped zinc oxide(AZO) films were deposited on glass substrates by mid-frequency magnetron sputtering. The effects of substrate rotation speed and target-substrate distance on the electrical, optical properties and microstructure and crystal structures of the resulting films were investigated by scanning electron microscopy(SEM), atomic force microscopy(AFM), X-ray diffraction(XRD), spectrophotometer and Hall-effect measurement system, respectively. XRD results show that all AZO films exhibit a strong preferred c-axis orientation. However, the crystallinity of films decreases with the increase of substrate rotation speed, accompanying with the unbalanced grains grows. For the films prepared at different target-substrate distances, the uniform microstructure and morphology are observed. The highest carrier concentration of 5.9×1020 cm-3 and Hall mobility of 13.1 cm^2/(V·s) are obtained at substrate rotation speed of 0 and target-substrate distance of 7 cm. The results indicate that the structure and performances of the AZO films are strongly affected by substrate rotation speed. 展开更多
关键词 ZnO thin film mid-frequency magnetron sputtering substrate rotation speed target-substrate distance optoelectronic performance
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ZnO:Al Films Prepared by Reactive Mid-frequency Magnetron Sputtering with Rotating Cathode 被引量:1
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作者 Ruijiang Hong Shuhua Xu 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2010年第10期872-877,共6页
Al-doped zinc oxide (ZnO:Al,AZO) films were deposited on glass substrates using a reactive mid-frequency (MF) magnetron sputtering process with rotating cathodes.The influence of deposition parameters on structur... Al-doped zinc oxide (ZnO:Al,AZO) films were deposited on glass substrates using a reactive mid-frequency (MF) magnetron sputtering process with rotating cathodes.The influence of deposition parameters on structural,electrical and optical properties of AZO films is investigated.It is observed that the rotating magnetron targets exhibited a sputtered metallic surface over a wider range,and there is no re-deposition zone between the racetracks.The films deposited at static deposition mode demonstrate more homogenous in thickness and resistivity across the target surface compared with conventional rectangular targets.The films deposited under the proper conditions show a regular cone-shaped grain surface and densely packed columnar structure.The minimum resistivity of 3.16×10-4 ·cm was obtained for the film prepared at substrate temperature of 150 C,gas pressure of 640 MPa and oxygen partial pressure of 34 MPa. 展开更多
关键词 Al-doped zinc oxide mid-frequency magnetron sputtering Properties
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中频交流反应溅射TiO_2薄膜制备及光催化性能研究 被引量:1
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作者 侯亚奇 张弓 +1 位作者 庄大明 吴敏生 《无机材料学报》 SCIE EI CAS CSCD 北大核心 2004年第5期1073-1079,共7页
利用中频交流反应磁控溅射技术制备TiO2薄膜,利用AES、XRD和SEM分析了制得的TiO2薄膜的成分、结构和表面形貌,并利用多种降解对象研究了TiO2薄膜的光催化降解性能.结果发现:利用Ar/O2混合气体反应溅射纯Ti靶制备的TiO2薄膜符合化学计量... 利用中频交流反应磁控溅射技术制备TiO2薄膜,利用AES、XRD和SEM分析了制得的TiO2薄膜的成分、结构和表面形貌,并利用多种降解对象研究了TiO2薄膜的光催化降解性能.结果发现:利用Ar/O2混合气体反应溅射纯Ti靶制备的TiO2薄膜符合化学计量比,呈现柱状生长.TiO2薄膜均为锐钛矿相,晶粒随薄膜厚度增加逐渐长大.制得的TiO2薄膜对亚甲基蓝、甲基橙和敌敌畏都具有确实的光催化降解效果,同时具有很好的光催化性能稳定性. 展开更多
关键词 TIO2薄膜 中频交流磁控溅射 光催化降解 亚甲基蓝 甲基橙
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交流磁控溅射技术及其应用 被引量:2
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作者 刘云峰 茅昕辉 +1 位作者 张浩康 陈国平 《电子器件》 CAS 1998年第1期1-5,共5页
本文阐述了交流溅射技术的原理、特点及其应用。
关键词 交流磁控溅射 脉冲溅射 薄膜
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磁控溅射制备Ag/TiO_2复合薄膜的光催化降解性能 被引量:8
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作者 侯亚奇 庄大明 +1 位作者 张弓 吴敏生 《清华大学学报(自然科学版)》 EI CAS CSCD 北大核心 2004年第5期589-592,608,共5页
为了提高TiO2薄膜的光催化效率,利用中频交流磁控溅射技术,采用Ti和Ag金属靶制备了Ag/TiO2复合薄膜。利用X射线光电子能谱、X射线衍射和扫描电子显微镜分析了复合薄膜的成分、结构和表面形貌,并研究了其光催化降解性能。结果发现:Ag在... 为了提高TiO2薄膜的光催化效率,利用中频交流磁控溅射技术,采用Ti和Ag金属靶制备了Ag/TiO2复合薄膜。利用X射线光电子能谱、X射线衍射和扫描电子显微镜分析了复合薄膜的成分、结构和表面形貌,并研究了其光催化降解性能。结果发现:Ag在厚度较薄时以聚集颗粒形式存在;在Ag膜厚度为15nm时,Ag/TiO2复合薄膜与TiO2薄膜相比其光催化效率可提高2倍;Ag/TiO2复合薄膜对亚甲基蓝的光催化降解效率与复合薄膜的透射率均随Ag膜厚度增加逐渐下降,其原因是Ag膜厚度不断增加,最终完全覆盖TiO2薄膜表面,阻挡了TiO2薄膜与污染物的有效接触,Ag作为光生电子捕获剂的有利影响消失。 展开更多
关键词 Ag/TiO2复合薄膜 光催化降解 中频交流磁控溅射 亚甲基蓝 X射线衍射
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退火温度对TiO_2薄膜光学性能的影响 被引量:1
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作者 侯亚奇 庄大明 +2 位作者 张弓 赵明 吴敏生 《清华大学学报(自然科学版)》 EI CAS CSCD 北大核心 2003年第11期1441-1443,共3页
为确定合适的TiO2薄膜退火工艺,研究了退火温度对采用中频交流反应磁控溅射技术制备的TiO2薄膜光学性能的影响。利用分光光度计测得石英玻璃基体TiO2薄膜试样的透射谱和反射谱,用包络线法和经验公式法计算出薄膜的光学常数。结果表明:T... 为确定合适的TiO2薄膜退火工艺,研究了退火温度对采用中频交流反应磁控溅射技术制备的TiO2薄膜光学性能的影响。利用分光光度计测得石英玻璃基体TiO2薄膜试样的透射谱和反射谱,用包络线法和经验公式法计算出薄膜的光学常数。结果表明:TiO2薄膜的折射率随退火温度的上升而增加,低温退火时薄膜消光系数略有减小,500℃退火时TiO2薄膜具有最优的光学性能。 展开更多
关键词 退火温度 二氧化钛薄膜 光学性能 中频交流磁控溅射 薄膜光学
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