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A Novel Technique of Measuring SOA Differential Carrier Lifetime and a -Factor Using SOA Optical Modulation Response
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作者 Ki-Hyuk Lee Woo-Young Choi 《光学学报》 EI CAS CSCD 北大核心 2003年第S1期503-504,共2页
We demonstrate a new technique of measuring differential carrier lifetime and linewidth enhancement factor in a semiconductor optical amplifier. In our method, the optical responses and fiber transfer functions of a s... We demonstrate a new technique of measuring differential carrier lifetime and linewidth enhancement factor in a semiconductor optical amplifier. In our method, the optical responses and fiber transfer functions of a self-gain modulated SOA are measured and, from these, values of carrier lifetimes and linewidth enhancement factors are determined for various SOA input optical powers. 展开更多
关键词 SOA in as A Novel Technique of Measuring SOA Differential Carrier Lifetime and a factor Using SOA Optical Modulation Response of
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Vacuum-sealed miniature modulated x-ray source and the influence factors of x-ray intensity
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作者 李保权 牟欢 《Chinese Optics Letters》 SCIE EI CAS CSCD 2016年第7期107-110,共4页
The vacuum-sealed miniature modulated x-ray source (VMMXS) with a hot cathode is fabricated via the single- step brazing process in a vacuum furnace. An experiment following the VMMXS is implemented to present its p... The vacuum-sealed miniature modulated x-ray source (VMMXS) with a hot cathode is fabricated via the single- step brazing process in a vacuum furnace. An experiment following the VMMXS is implemented to present its performances, including the influence of grid electrode potential on x-ray intensities. The modulation type of the grid electrode as a switch is proposed, and its feasibility is successfully demonstrated. It is noteworthy to discover a phenomenon for the first time, to the best of our knowledge, that the high repetition frequency grid pulse of the VMMXS has a significant effect on the x-ray intensity. The probable cause for this new finding is analyzed. 展开更多
关键词 Vacuum-sealed miniature modulated x-ray source and the influence factors of x-ray intensity
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