期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
MEASURING C PROGRAM COVERAGE BASED ON BINARY DECISION DIAGRAMS
1
作者 ShiLiang XuBaowen ChenLin 《Journal of Electronics(China)》 2005年第1期90-93,共4页
Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce t... Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce tests for the Multiple-Condition Criterion(M-CC) and the Modified Condition/Decision Criterion(MC/DC), and describes the design of the C program Coverage Measurement Tool (CCMT), which can record dynamic behaviors of C programs and quantify test coverage. 展开更多
关键词 Software testing Test coverage multiple-condition Coverage(M-CC) Modified Condition/Decision Coverage(MC/DC)
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部